The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
May. 20, 2024
Nuflare Technology, Inc., Yokohama, JP;
Kenichi Yasui, Kawasaki, JP;
NuFlare Technology, Inc., Yokohama, JP;
Abstract
A drawing data examination method acquires coordinates representing the positions of a plurality of control points forming the B-spline curve; sets, as an examination target region of the drawing data, a region surrounded by a line segment connecting at least three or more control points adjacent to each other in the drawing data with a straight line after acquiring the coordinates; performs calculation processing of specifying a relative position of an examination target control point with respect to the examination target region by using the coordinates of the examination target control point and control points of the examination target region with respect to the examination target region; and determines whether the figure of the drawing data has an intersection by determining whether the examination target control point exists inside the examination target region based on the relative position.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile