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Migdal Haemek, Israel

Jordan Valley Applied Radiation Ltd.

USPTO Granted Patents = 30

Trademarks = 2

Forward Citations = 983

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18 inventors (with patents filed for the assignee):

Boris Yokhin (24 out of 37 patents)

Isaac Mazor (20 out of 41 patents)

Amos Gvirtzman (9 out of 12 patents)

4. David Berman (8 out of 18 patents)

5. Alex Dikopoltsev (5 out of 15 patents)

6. Dileep Kumar Agnihotri (4 out of 11 patents)

7. Tzachi Rafaeli (4 out of 6 patents)

8. Alexander Dikopoltsev (3 out of 4 patents)

9. Asher Peled (2 out of 13 patents)

10. Long Vu (2 out of 2 patents)

11. Alex Tokar (1 out of 7 patents)

12. David Bar-On (1 out of 7 patents)

13. Sean Jameson (1 out of 1 patent)

14. Tachi Rafaeli (1 out of 1 patent)

15. Ami Dovrat (1 out of 1 patent)

30 patents: Sort by Forward Citations

1. 7481579 - Overlay metrology using X-rays (2009-01-27),

2. 7474732 - Calibration of X-ray reflectometry system (2009-01-06),

3. 7245695 - Detection of dishing and tilting using X-ray fluorescence (2007-07-17),

4. 7231016 - Efficient measurement of diffuse X-ray reflections (2007-06-12),

5. 7130376 - X-ray reflectometry of thin film layers with enhanced accuracy (2006-10-31),

6. 7120228 - Combined X-ray reflectometer and diffractometer (2006-10-10),

7. 7113566 - Enhancing resolution of X-ray measurements by sample motion (2006-09-26),

8. 7110491 - Measurement of critical dimensions using X-ray diffraction in reflection mode (2006-09-19),

9. 7103142 - Material analysis using multiple X-ray reflectometry models (2006-09-05),

10. 7076024 - X-ray apparatus with dual monochromators (2006-07-11),

11. 7068753 - Enhancement of X-ray reflectometry by measurement of diffuse reflections (2006-06-27),

12. 7062013 - X-ray reflectometry of thin film layers with enhanced accuracy (2006-06-13),

13. 7035375 - X-ray scattering with a polychromatic source (2006-04-25),

14. 7023954 - Optical alignment of X-ray microanalyzers (2006-04-04),

15. 6947520 - Beam centering and angle calibration for X-ray reflectometry (2005-09-20),

Jordan Valley Applied Radiation Ltd. is a leading provider of metrology solutions for thin films and materials characterization in the semiconductor industry. They offer non-destructive, non-contact metrology tools that enable the monitoring and control of thin film processes during manufacturing. With an extensive portfolio of X-ray and optical sensors, their systems offer high-precision measurements and advanced analytics for improved process control and yield optimization.

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USPTO Data Jan 1 1976 - Dec 30 2025

30 Patents

#3 in Migdal Haemek

#177 in Israel

#21,209 in the World

Migdal Haemek, Israel

Jordan Valley Applied Radiation Ltd.

Forward Citations = 983

18 inventors:

Boris Yokhin (24 out of 37 patents)

Isaac Mazor (20 out of 41 patents)

Amos Gvirtzman (9 out of 12 patents)

4. David Berman (8 out of 18 patents)

5. Alex Dikopoltsev (5 out of 15 patents)

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