For the Inventor, By the Inventor

Enter assignee name

Migdal Haemek, Israel

Jordan Valley Applied Radiation Ltd.

Calculating rank

USPTO Granted Patents = 30

Forward Citations = 993

Loading Chart...

Loading Chart...

18 inventors (with patents filed for the assignee):

Boris Yokhin (24 out of 37 patents)

Isaac Mazor (20 out of 41 patents)

Amos Gvirtzman (9 out of 12 patents)

4. David Berman (8 out of 18 patents)

5. Alex Dikopoltsev (5 out of 15 patents)

6. Dileep Kumar Agnihotri (4 out of 11 patents)

7. Tzachi Rafaeli (4 out of 6 patents)

8. Alexander Dikopoltsev (3 out of 5 patents)

9. Asher Peled (2 out of 13 patents)

10. Long Vu (2 out of 2 patents)

11. Alex Tokar (1 out of 7 patents)

12. David Bar-On (1 out of 7 patents)

13. Sean Jameson (1 out of 1 patent)

14. Tachi Rafaeli (1 out of 1 patent)

15. Ami Dovrat (1 out of 1 patent)

Core Competencies:

X-Ray Reflectometry

Thin Film Analysis

X-Ray Diffraction

Microanalysis

Calibration

Material Analysis

X-Ray Fluorescence

Measurement Techniques

X-Ray Microfluorescence

Semiconductor Processing

Optical Alignment

Polychromatic Source

30 patents: Sort by Forward Citations

1. 7481579 - Overlay metrology using X-rays (2009-01-27),

2. 7474732 - Calibration of X-ray reflectometry system (2009-01-06),

3. 7245695 - Detection of dishing and tilting using X-ray fluorescence (2007-07-17),

4. 7231016 - Efficient measurement of diffuse X-ray reflections (2007-06-12),

5. 7130376 - X-ray reflectometry of thin film layers with enhanced accuracy (2006-10-31),

6. 7120228 - Combined X-ray reflectometer and diffractometer (2006-10-10),

7. 7113566 - Enhancing resolution of X-ray measurements by sample motion (2006-09-26),

8. 7110491 - Measurement of critical dimensions using X-ray diffraction in reflection mode (2006-09-19),

9. 7103142 - Material analysis using multiple X-ray reflectometry models (2006-09-05),

10. 7076024 - X-ray apparatus with dual monochromators (2006-07-11),

11. 7068753 - Enhancement of X-ray reflectometry by measurement of diffuse reflections (2006-06-27),

12. 7062013 - X-ray reflectometry of thin film layers with enhanced accuracy (2006-06-13),

13. 7035375 - X-ray scattering with a polychromatic source (2006-04-25),

14. 7023954 - Optical alignment of X-ray microanalyzers (2006-04-04),

15. 6947520 - Beam centering and angle calibration for X-ray reflectometry (2005-09-20),

Company Overview

Jordan Valley Applied Radiation Ltd. is a leading provider of advanced measurement and inspection solutions for the semiconductor industry. The company specializes in developing innovative technologies that enhance the manufacturing processes of semiconductor devices. With a focus on precision and reliability, Jordan Valley's products are integral to ensuring quality control and efficiency in semiconductor fabrication. Headquartered in Migdal Haemek, Israel, the company plays a crucial role in supporting the global semiconductor supply chain.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

30 Patents

#4 in Migdal Haemek

#196 in Israel

#21,924 in the World

Migdal Haemek, Israel

Jordan Valley Applied Radiation Ltd.

Forward Citations = 993

18 inventors:

Boris Yokhin (24 out of 37 patents)

Isaac Mazor (20 out of 41 patents)

Amos Gvirtzman (9 out of 12 patents)

4. David Berman (8 out of 18 patents)

5. Alex Dikopoltsev (5 out of 15 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Jordan Valley Applied Radiation Ltd.. Retrieved from https://idiyas.com/company/jordan-valley-applied-radiation

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…