Company Filing History:
5 out of 30 
5 out of 16 
3 out of 11 
Years Active: 2006-2024
Title: **Alex Dikopoltsev: Innovator in X-ray Scatterometry**
Introduction
Alex Dikopoltsev is a distinguished inventor based in Haifa, Israel, with an impressive portfolio of 15 patents. His innovative contributions primarily focus on the field of X-ray scatterometry, where he has developed groundbreaking methods to evaluate complex structural elements in samples.
Latest Patents
Dikopoltsev's latest patents include notable methods such as "Small-angle X-ray Scatterometry." This patent describes a unique approach for evaluating samples containing an array of structural elements. The method involves obtaining a first small-angle X-ray scattering (SAXS) pattern, adjusting angular relationships between the sample and the X-ray beam, and differing collimation values to extract critical structural information. Another significant patent is "Small-angle X-ray Scatterometry for High Aspect Ratio Structures," which outlines a process for illuminating samples with X-ray beams along axes parallel and oblique to high aspect ratio structures, allowing for the extraction of detailed information based on the scattering patterns.
Career Highlights
Throughout his career, Alex Dikopoltsev has worked with reputable companies in the field of radiation technology and material analysis. He contributed his expertise to Jordan Valley Applied Radiation Ltd. and Bruker Technologies Ltd., both known for their innovative solutions in scientific instrumentation. His work has played a vital role in advancing methodologies for sample evaluation using X-ray techniques.
Collaborations
Dikopoltsev has collaborated with several esteemed professionals in his field, including notable coworkers such as Isaac Mazor and Matthew Wormington. Their collective expertise has contributed to the development of innovative techniques and enhanced the credibility of their research and applications.
Conclusion
With 15 patents to his name, Alex Dikopoltsev continues to be a trailblazer in the realm of X-ray scatterometry. His innovative methods for evaluating complex structures have profound implications for various scientific and industrial applications. As he continues to develop his work, Dikopoltsev remains a significant figure in advancing X-ray technology and its diverse applications.
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