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Migdal Haemek, Israel

Bruker Technologies Ltd.

USPTO Granted Patents = 17

Forward Citations = 66

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24 inventors (with patents filed for the assignee):

Matthew Wormington (11 out of 25 patents)

Alexander Krokhmal (10 out of 15 patents)

Alex Dikopoltsev (5 out of 15 patents)

4. Yuri Vinshtein (5 out of 6 patents)

5. Asher Peled (4 out of 13 patents)

6. Alex Krokhmal (2 out of 3 patents)

7. Juri Vinshtein (2 out of 2 patents)

8. John Leonard Wall (2 out of 9 patents)

9. Guy Sheaffer (1 out of 1 patent)

10. Kevin Monroe Matney (1 out of 1 patent)

11. Oliver Whear (1 out of 1 patent)

12. Richard Thake Bytheway (1 out of 1 patent)

13. Dor Perry (1 out of 2 patents)

14. Nikolai Kasper (1 out of 2 patents)

15. Juliette P M Van Der Meer (1 out of 1 patent)

17 patents: Sort by Forward Citations

1. 12535438 - Analysis of x-ray scatterometry data using deep learning (2026-01-27),

2. 12339239 - X-ray diffraction imaging detector having multiple angled input faces (2025-06-24),

3. 12249059 - Navigation accuracy using camera coupled with detector assembly (2025-03-11),

4. 12085521 - Small-angle X-ray scatterometry (2024-09-10),

5. 12078604 - Monitoring properties of X-ray beam during X-ray analysis (2024-09-03),

6. 11781999 - Spot-size control in reflection-based and scatterometry-based X-ray metrology systems (2023-10-10),

7. 11761913 - Transmission X-ray critical dimension (T-XCD) characterization of shift and tilt of stacks of high-aspect-ratio (HAR) structures (2023-09-19),

8. 11703464 - Small-angle x-ray scatterometry (2023-07-18),

9. 11302508 - X-ray tube (2022-04-12),

10. 11181490 - Small-angle x-ray scatterometry (2021-11-23),

11. 11169099 - Method and apparatus for X-ray scatterometry (2021-11-09),

12. 10976270 - X-ray detection optics for small-angle X-ray scatterometry (2021-04-13),

13. 10976269 - Wafer alignment for small-angle x-ray scatterometry (2021-04-13),

14. 10976268 - X-ray source optics for small-angle X-ray scatterometry (2021-04-13),

15. 10816487 - Image contrast in X-ray topography imaging for defect inspection (2020-10-27),

Bruker Technologies Ltd., located in Migdal Haemek, Israel, specializes in the development and manufacturing of advanced analytical instruments and solutions. The company focuses on various domains, including life sciences, materials research, and industrial applications. Bruker is recognized for its innovative technologies in spectroscopy, microscopy, and mass spectrometry, catering to a global clientele. The organization's commitment to research and development positions it as a leader in providing high-performance tools for scientific discovery and quality control.

Profile summary based on public USPTO records.

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USPTO Data Jan 1 1976 - Oct 6 2026

17 Patents

#7 in Migdal Haemek

#374 in Israel

#35,887 in the World

Migdal Haemek, Israel

Bruker Technologies Ltd.

Forward Citations = 66

24 inventors:

Matthew Wormington (11 out of 25 patents)

Alexander Krokhmal (10 out of 15 patents)

Alex Dikopoltsev (5 out of 15 patents)

4. Yuri Vinshtein (5 out of 6 patents)

5. Asher Peled (4 out of 13 patents)

Please report any incorrect information to [email protected]

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