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Migdal Haemek, Israel

Bruker Technologies Ltd.

USPTO Granted Patents = 16

Trademarks = 15

Forward Citations = 61

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21 inventors (with patents filed for the assignee):

Alexander Krokhmal (10 out of 15 patents)

Matthew Wormington (10 out of 24 patents)

Alex Dikopoltsev (5 out of 15 patents)

4. Yuri Vinshtein (5 out of 6 patents)

5. Asher Peled (4 out of 13 patents)

6. Alex Krokhmal (2 out of 3 patents)

7. Juri Vinshtein (2 out of 2 patents)

8. John Leonard Wall (2 out of 9 patents)

9. Guy Sheaffer (1 out of 1 patent)

10. Kevin Monroe Matney (1 out of 1 patent)

11. Oliver Whear (1 out of 1 patent)

12. Richard Thake Bytheway (1 out of 1 patent)

13. Dor Perry (1 out of 2 patents)

14. Nikolai Kasper (1 out of 2 patents)

15. Juliette P M Van Der Meer (1 out of 1 patent)

16 patents: Sort by Forward Citations

1. 12339239 - X-ray diffraction imaging detector having multiple angled input faces (2025-06-24),

2. 12249059 - Navigation accuracy using camera coupled with detector assembly (2025-03-11),

3. 12085521 - Small-angle X-ray scatterometry (2024-09-10),

4. 12078604 - Monitoring properties of X-ray beam during X-ray analysis (2024-09-03),

5. 11781999 - Spot-size control in reflection-based and scatterometry-based X-ray metrology systems (2023-10-10),

6. 11761913 - Transmission X-ray critical dimension (T-XCD) characterization of shift and tilt of stacks of high-aspect-ratio (HAR) structures (2023-09-19),

7. 11703464 - Small-angle x-ray scatterometry (2023-07-18),

8. 11302508 - X-ray tube (2022-04-12),

9. 11181490 - Small-angle x-ray scatterometry (2021-11-23),

10. 11169099 - Method and apparatus for X-ray scatterometry (2021-11-09),

11. 10976270 - X-ray detection optics for small-angle X-ray scatterometry (2021-04-13),

12. 10976269 - Wafer alignment for small-angle x-ray scatterometry (2021-04-13),

13. 10976268 - X-ray source optics for small-angle X-ray scatterometry (2021-04-13),

14. 10816487 - Image contrast in X-ray topography imaging for defect inspection (2020-10-27),

15. 10684238 - Method and apparatus for X-ray scatterometry (2020-06-16),

Bruker Technologies Ltd. is a leading provider of scientific instruments and solutions for molecular and materials research, as well as for industrial and applied analysis. With a wide range of cutting-edge technologies, Bruker serves customers in various industries including pharmaceuticals, biotechnology, food and beverage, and more. The company is committed to innovation and advancing scientific discovery.

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Company Badge

USPTO Data Jan 1 1976 - Dec 2 2025

16 Patents

#6 in Migdal Haemek

#370 in Israel

#36,617 in the World

Migdal Haemek, Israel

Bruker Technologies Ltd.

Forward Citations = 61

21 inventors:

Alexander Krokhmal (10 out of 15 patents)

Matthew Wormington (10 out of 24 patents)

Alex Dikopoltsev (5 out of 15 patents)

4. Yuri Vinshtein (5 out of 6 patents)

5. Asher Peled (4 out of 13 patents)

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