The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2025

Filed:

Mar. 31, 2022
Applicant:

Bruker Technologies Ltd., Migdal HaEmek, IL;

Inventors:

Alexander Krokhmal, Haifa, IL;

Alexander Brandt, Tiberias, IL;

Dor Perry, Haifa, IL;

Asher Peled, Kfar-Vradim, IL;

Matthew Wormington, Highlands Ranch, CO (US);

Assignee:

Bruker Technologies Ltd., Migdal HaEmek, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A system includes first and second imaging assemblies, and a processor. The first imaging assembly is configured to produce a first image of a measurement site in a sample. The second imaging assembly is coupled with a measurement assembly and is configured to produce a second image of the measurement site. The processor is configured to: (i) perform, based on the first image, a first movement of the sample relative to the measurement assembly, (ii) perform, based on the second image, a second movement of the sample for aligning the sample with the measurement assembly, and (iii) control the measurement assembly to perform a measurement in the measurement site.


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