Dor Perry

Title: Dor Perry: Innovator in Navigation and Metrology Technologies

Introduction

Dor Perry is a notable inventor based in Haifa, Israel, recognized for his contributions to navigation accuracy and overlay metrology. With a total of 2 patents, Perry has developed innovative systems that enhance measurement precision in various applications.

Latest Patents

Perry's latest patents include a system for navigation accuracy using a camera coupled with a detector assembly. This system features first and second imaging assemblies, along with a processor that performs movements of a sample relative to the measurement assembly based on images captured. The processor ensures precise alignment and measurement at the measurement site. Another significant patent is for localized telecentricity and focus optimization for overlay metrology. This tool provides site-by-site alignment and utilizes a telecentric imaging system to capture alignment images, generate alignment data, and determine overlay between layers of a sample.

Career Highlights

Throughout his career, Dor Perry has worked with prominent companies such as Kla Tencor Corporation and Bruker Technologies Ltd. His experience in these organizations has contributed to his expertise in developing advanced measurement technologies.

Collaborations

Perry has collaborated with notable individuals in the field, including Andrew V. Hill and Ohad Bachar. These partnerships have likely enriched his work and led to further innovations in his projects.

Conclusion

Dor Perry's innovative patents and career achievements highlight his significant impact on navigation and metrology technologies. His work continues to influence advancements in precision measurement systems.