Company Filing History:
Years Active: 2019-2024
Title: The Innovative Contributions of Yuri Vinshtein
Introduction
Yuri Vinshtein is a notable inventor based in Hadera, Israel. He has made significant contributions to the field of x-ray scatterometry, with a total of 6 patents to his name. His work focuses on methods for evaluating samples that include structural elements, showcasing his expertise in advanced imaging techniques.
Latest Patents
Vinshtein's latest patents include innovative methods for small-angle x-ray scatterometry. One method involves evaluating a sample by obtaining a first SAXS pattern for a specific angular relationship between the sample and an x-ray beam. This method allows for precise measurements by varying the collimation value of the x-ray beam while maintaining a consistent cross-sectional area. Another patent details a method for evaluating high aspect ratio structures on a sample. This involves illuminating the sample with an x-ray beam along two different axes to extract valuable information about the HAR structures based on the scattering patterns observed.
Career Highlights
Throughout his career, Yuri Vinshtein has worked with prominent companies in the field, including Bruker Technologies Ltd. and Bruker JV Israel Ltd. His experience in these organizations has allowed him to develop and refine his innovative techniques in x-ray scatterometry.
Collaborations
Vinshtein has collaborated with talented individuals such as Matthew Wormington and Alexander Krokhmal. These partnerships have contributed to the advancement of his research and the successful development of his patented methods.
Conclusion
Yuri Vinshtein's contributions to the field of x-ray scatterometry highlight his innovative spirit and dedication to advancing technology. His patents reflect a deep understanding of structural evaluation methods, making him a significant figure in his area of expertise.