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Migdal Haemek, Israel

Jordan Valley Semiconductors Ltd.

USPTO Granted Patents = 24

Trademarks = 3

Forward Citations = 328

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29 inventors (with patents filed for the assignee):

Boris Yokhin (9 out of 37 patents)

David Berman (8 out of 18 patents)

Isaac Mazor (7 out of 41 patents)

4. Dale A Harrison (6 out of 37 patents)

5. Matthew Wormington (5 out of 24 patents)

6. Alexander Krokhmal (4 out of 15 patents)

7. Phillip Walsh (4 out of 18 patents)

8. Dileep Kumar Agnihotri (3 out of 11 patents)

9. John Leonard Wall (3 out of 9 patents)

10. Paul Anthony Ryan (3 out of 5 patents)

11. Asher Peled (2 out of 13 patents)

12. Alex Tokar (2 out of 7 patents)

13. Alexander Krohmal (2 out of 4 patents)

14. Gennady Openganden (2 out of 3 patents)

15. Alexander Tokar (2 out of 2 patents)

24 patents: Sort by Forward Citations

1. 9269468 - X-ray beam conditioning (2016-02-23),

2. 8781070 - Detection of wafer-edge defects (2014-07-15),

3. 8687766 - Enhancing accuracy of fast high-resolution X-ray diffractometry (2014-04-01),

4. 8565379 - Combining X-ray and VUV analysis of thin film layers (2013-10-22),

5. 8564780 - Method and system for using reflectometry below deep ultra-violet (DUV) wavelengths for measuring properties of diffracting or scattering structures on substrate work pieces (2013-10-22),

6. 8437450 - Fast measurement of X-ray diffraction from tilted layers (2013-05-07),

7. 8243878 - High-resolution X-ray diffraction measurement with enhanced sensitivity (2012-08-14),

8. 8153987 - Automated calibration methodology for VUV metrology system (2012-04-10),

9. 8119991 - Method and apparatus for accurate calibration of VUV reflectometer (2012-02-21),

10. 8054453 - Broad band referencing reflectometer (2011-11-08),

11. 8014000 - Broad band referencing reflectometer (2011-09-06),

12. 7990549 - Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientation (2011-08-02),

13. 7948631 - Method and apparatus for using multiple relative reflectance measurements to determine properties of a sample using vacuum ultra violet wavelengths (2011-05-24),

14. 7804934 - Accurate measurement of layer dimensions using XRF (2010-09-28),

15. 7804059 - Method and apparatus for accurate calibration of VUV reflectometer (2010-09-28),

Jordan Valley Semiconductors Ltd. specializes in the development and manufacturing of advanced X-ray metrology solutions for the semiconductor industry. With extensive experience and expertise in X-ray diffraction (XRD) and X-ray reflectometry (XRR) technologies, Jordan Valley delivers innovative solutions for materials analysis, thin film measurements, process control, and more. Their cutting-edge X-ray metrology tools are utilized by leading semiconductor manufacturers worldwide, empowering them to improve yield, enhance productivity, and ensure the highest quality in their semiconductor fabrication processes.

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Company Badge

USPTO Data Jan 1 1976 - Jan 6 2026

24 Patents

#4 in Migdal Haemek

#236 in Israel

#25,875 in the World

Migdal Haemek, Israel

Jordan Valley Semiconductors Ltd.

Forward Citations = 328

29 inventors:

Boris Yokhin (9 out of 37 patents)

David Berman (8 out of 18 patents)

Isaac Mazor (7 out of 41 patents)

4. Dale A Harrison (6 out of 37 patents)

5. Matthew Wormington (5 out of 24 patents)

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