For the Inventor, By the Inventor

Enter assignee name

Migdal Haemek, Israel

Jordan Valley Semiconductors Ltd.

Calculating rank

USPTO Granted Patents = 24

Forward Citations = 340

Loading Chart...

Loading Chart...

29 inventors (with patents filed for the assignee):

Boris Yokhin (9 out of 37 patents)

David Berman (8 out of 18 patents)

Isaac Mazor (7 out of 41 patents)

4. Dale A Harrison (6 out of 39 patents)

5. Matthew Wormington (5 out of 25 patents)

6. Alexander Krokhmal (4 out of 15 patents)

7. Phillip Walsh (4 out of 18 patents)

8. Dileep Kumar Agnihotri (3 out of 11 patents)

9. John Leonard Wall (3 out of 9 patents)

10. Paul Anthony Ryan (3 out of 5 patents)

11. Asher Peled (2 out of 13 patents)

12. Alex Tokar (2 out of 7 patents)

13. Alexander Krohmal (2 out of 4 patents)

14. Gennady Openganden (2 out of 3 patents)

15. Alexander Tokar (2 out of 2 patents)

24 patents: Sort by Forward Citations

1. 9269468 - X-ray beam conditioning (2016-02-23),

2. 8781070 - Detection of wafer-edge defects (2014-07-15),

3. 8687766 - Enhancing accuracy of fast high-resolution X-ray diffractometry (2014-04-01),

4. 8565379 - Combining X-ray and VUV analysis of thin film layers (2013-10-22),

5. 8564780 - Method and system for using reflectometry below deep ultra-violet (DUV) wavelengths for measuring properties of diffracting or scattering structures on substrate work pieces (2013-10-22),

6. 8437450 - Fast measurement of X-ray diffraction from tilted layers (2013-05-07),

7. 8243878 - High-resolution X-ray diffraction measurement with enhanced sensitivity (2012-08-14),

8. 8153987 - Automated calibration methodology for VUV metrology system (2012-04-10),

9. 8119991 - Method and apparatus for accurate calibration of VUV reflectometer (2012-02-21),

10. 8054453 - Broad band referencing reflectometer (2011-11-08),

11. 8014000 - Broad band referencing reflectometer (2011-09-06),

12. 7990549 - Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientation (2011-08-02),

13. 7948631 - Method and apparatus for using multiple relative reflectance measurements to determine properties of a sample using vacuum ultra violet wavelengths (2011-05-24),

14. 7804934 - Accurate measurement of layer dimensions using XRF (2010-09-28),

15. 7804059 - Method and apparatus for accurate calibration of VUV reflectometer (2010-09-28),

Company Overview

Jordan Valley Semiconductors Ltd. is a leading provider of advanced metrology solutions for the semiconductor industry, specializing in the development of innovative measurement systems. The company focuses on enhancing process control and yield management through its cutting-edge technologies, which are crucial for semiconductor manufacturing. Headquartered in Migdal Haemek, Israel, Jordan Valley serves a global clientele, contributing significantly to the advancement of semiconductor fabrication processes.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

24 Patents

#5 in Migdal Haemek

#258 in Israel

#26,701 in the World

Migdal Haemek, Israel

Jordan Valley Semiconductors Ltd.

Forward Citations = 340

29 inventors:

Boris Yokhin (9 out of 37 patents)

David Berman (8 out of 18 patents)

Isaac Mazor (7 out of 41 patents)

4. Dale A Harrison (6 out of 39 patents)

5. Matthew Wormington (5 out of 25 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Jordan Valley Semiconductors Ltd.. Retrieved from https://idiyas.com/company/jordan-valley-semiconductors

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…