Company Filing History:
Years Active: 2010
Title: Alexander Tokar: Innovator in X-ray Measurement Technologies
Introduction
Alexander Tokar is a prominent inventor based in Haifa, Israel. He has made significant contributions to the field of X-ray measurement technologies, particularly in the analysis of nano-particles. With a total of 2 patents to his name, Tokar's work has advanced the understanding and inspection of small features in various materials.
Latest Patents
Tokar's latest patents include innovative methods for analyzing samples using X-ray technology. One of his patents focuses on the "X-ray measurement of properties of nano-particles." This method involves directing one or more beams of X-rays onto a surface area where a layer of nano-particles has been formed. The secondary X-ray radiation detected from this area allows for the characterization of the distribution of nano-particles on the surface.
Another notable patent is for "Inspection of small features using X-ray fluorescence." This method entails irradiating a sample with a focused X-ray beam to define a spot on the surface. By scanning the spot along a path that crosses a feature, Tokar's technique measures the intensities of X-ray fluorescence emitted from the sample. This data is then processed to estimate the thickness of the feature based on the adjusted values of the emitted X-ray fluorescence.
Career Highlights
Alexander Tokar is currently employed at Jordan Valley Semiconductors Ltd., where he continues to develop cutting-edge technologies in the field of X-ray measurement. His work has garnered attention for its practical applications in various industries, including semiconductor manufacturing and materials science.
Collaborations
Throughout his career, Tokar has collaborated with notable colleagues, including Boris Yokhin and Alexander Krokhmal. These partnerships have contributed to the advancement of innovative solutions in the realm of X-ray technologies.
Conclusion
In summary, Alexander Tokar is a distinguished inventor whose work in X-ray measurement technologies has led to significant advancements in the analysis of nano-particles and small features. His contributions continue to impact various fields, showcasing the importance of innovation in scientific research and development.