Company Filing History:
4 out of 11 
2 out of 24 
1 out of 30 Years Active: 2007-2017
Title: Innovations of Inventor Alex Tokar
Introduction
Alex Tokar is a notable inventor based in Haifa, Israel, recognized for his contributions to the field of X-ray fluorescence (XRF) measurement. With a total of seven patents to his name, Tokar has developed innovative methods that enhance the accuracy and efficiency of measuring small features on various substrates.
Latest Patents
Among his latest patents, one significant innovation is the "Measurement of small features using XRF." This method involves a calibration phase where a first X-ray beam scans across a feature of interest on a calibration sample. The first X-ray fluorescence emitted from the feature and surrounding areas is measured, allowing for the computation of a relative emission factor. In the test phase, a second X-ray beam with a different profile is directed at the feature on a test sample, and the property of the feature is computed using the relative emission factor and the measured second XRF.
Another important patent is the "Method for accurately determining the thickness and/or elemental composition of small features on thin substrates using micro-XRF." This method includes directing an X-ray beam onto a sample and measuring the XRF signal in both reference and target measurements. By reducing the contribution of first layers in the target XRF spectrum using the reference spectrum, Tokar's method allows for accurate estimation of parameters related to the second layers formed on the substrate.
Career Highlights
Throughout his career, Alex Tokar has worked with prominent companies such as Bruker JV Israel Ltd. and Jordan Valley Semiconductors Ltd. His experience in these organizations has contributed to his expertise in XRF technology and its applications in various industries.
Collaborations
Tokar has collaborated with notable professionals in his field, including Isaac Mazor and Alex Dikopoltsev. These collaborations have further enriched his work and contributed to the advancement of XRF measurement techniques.
Conclusion
Alex Tokar's innovative patents and career achievements highlight his significant contributions to the field of X-ray fluorescence measurement. His work continues to influence advancements in the accurate measurement of small features, showcasing the importance of innovation in technology.