The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2008
Filed:
Sep. 15, 2006
Applicants:
Boris Yokhin, Nazareth Illit, IL;
Alexander Krokhmal, Haifa, IL;
Alex Tokar, Haifa, IL;
Inventors:
Assignee:
Jordan Valley Semiconductors Ltd., Migdal Ha'emek, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for analysis of a sample includes irradiating an area of the sample with a polychromatic X-ray beam. X-rays scattered from the sample are detected using a plurality of detectors simultaneously in different, respective positions, whereby the detectors generate respective outputs. Energy-dispersive processing is applied to the outputs of the detectors so as to identify one or more X-ray diffraction lines of the sample.