The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Apr. 11, 2005
Isaac Mazor, Haifa, IL;
Alex Dikopoltsev, Haifa, IL;
Boris Yokhin, Nazareth Illit, IL;
Tzachi Rafaeli, Givat Shimshit, IL;
Alex Tokar, Haifa, IL;
Isaac Mazor, Haifa, IL;
Alex Dikopoltsev, Haifa, IL;
Boris Yokhin, Nazareth Illit, IL;
Tzachi Rafaeli, Givat Shimshit, IL;
Alex Tokar, Haifa, IL;
Jordan Valley Applied Radiation Ltd., Migdal Ha'emek, IL;
Abstract
A method for testing a material applied to a surface of a sample includes directing an excitation beam, having a known beam-width and intensity cross-section, onto a region of the sample. An intensity of X-ray fluorescence emitted from the region responsively to the excitation beam is measured. A distribution of the material within the region is estimated, responsively to the measured intensity of the X-ray fluorescence and to the intensity cross-section of the excitation beam, with a spatial resolution that is finer than the beam-width.