The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Jul. 12, 2011
Applicants:
Matthew Wormington, Littleton, CO (US);
Alexander Krohmal, Haifa, IL;
David Berman, Tivon, IL;
Gennady Openganden, Kiryat Yam, IL;
Inventors:
Matthew Wormington, Littleton, CO (US);
Alexander Krohmal, Haifa, IL;
David Berman, Tivon, IL;
Gennady Openganden, Kiryat Yam, IL;
Assignee:
Jordan Valley Semiconductors Ltd., Migdal Ha'Emek, IL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for analysis includes directing a converging beam of X-rays toward a surface of a sample and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum of the sample. The diffraction spectrum is corrected to compensate for a non-uniform property of the converging beam.