Company Filing History:
2 out of 24 
1 out of 3 Years Active: 2012-2014
Title: Gennady Openganden: Innovator in X-ray Diffraction Technology
Introduction
Gennady Openganden is a notable inventor based in Kiryat Yam, Israel. He has made significant contributions to the field of X-ray diffraction measurement, holding a total of three patents. His innovative methods enhance the sensitivity and accuracy of X-ray analysis, which is crucial in various scientific and industrial applications.
Latest Patents
Openganden's latest patents include a method for high-resolution X-ray diffraction measurement with enhanced sensitivity. This method involves directing a converging beam of X-rays toward a sample's surface that has an epitaxial layer. The X-rays diffracted from the sample are sensed and resolved as a function of angle, generating a diffraction spectrum that includes a diffraction peak and fringes. The analysis of these fringes allows for the measurement of the relaxation of the epitaxial layer.
Another significant patent focuses on enhancing the accuracy of fast high-resolution X-ray diffractometry. This method also directs a converging beam of X-rays toward a sample's surface and senses the diffracted X-rays. The generated diffraction spectrum is corrected to account for any non-uniform properties of the converging beam, ensuring precise measurements.
Career Highlights
Throughout his career, Gennady Openganden has worked with prominent companies in the semiconductor industry, including Jordan Valley Semiconductors Ltd. and Jordan Valley Semiconductor Ltd. His expertise in X-ray diffraction technology has positioned him as a valuable asset in these organizations.
Collaborations
Openganden has collaborated with notable professionals in his field, including Matthew Wormington and Alexander Krohmal. These collaborations have likely contributed to the advancement of his innovative methods and patents.
Conclusion
Gennady Openganden is a distinguished inventor whose work in X-ray diffraction technology has led to significant advancements in the field. His patents reflect a commitment to enhancing measurement accuracy and sensitivity, making a lasting impact on scientific research and industrial applications.