Givat Shimshit, Israel

Tachi Rafaeli

This inventor holds 1 USPTO granted patent. Top assignee: Jordan Valley Applied Radiation Ltd.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tachi Rafaeli. Retrieved from https://idiyas.com/inventor/tachi-rafaeli

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Tachi Rafaeli: Innovator in X-ray Reflectometry

Introduction

Tachi Rafaeli is a notable inventor based in Givat Shimshit, Israel. He has made significant contributions to the field of X-ray technology, particularly in the calibration of X-ray reflectometry systems. His innovative approach has led to advancements in the inspection of samples using X-ray beams.

Latest Patents

Tachi Rafaeli holds a patent for a method that involves irradiating a sample with a beam of X-rays and measuring the distribution of the emitted X-rays. This process generates an X-ray spectrum, which is then assessed for non-uniformities in the beam. The spectrum is corrected based on the identified effects, enhancing the accuracy of the inspection process.

Career Highlights

Rafaeli is associated with Jordan Valley Applied Radiation Ltd., where he applies his expertise in X-ray technology. His work has been instrumental in developing methods that improve the reliability of X-ray inspections in various applications.

Collaborations

Some of Tachi Rafaeli's coworkers include David Berman and Asher Peled. Their collaborative efforts contribute to the innovative environment at Jordan Valley Applied Radiation Ltd.

Conclusion

Tachi Rafaeli's contributions to X-ray reflectometry exemplify the impact of innovation in scientific research and technology. His work continues to influence the field and improve inspection methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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