The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2009
Filed:
Dec. 01, 2004
David Berman, Kiryat Tivon, IL;
Asher Peled, Kfar Vradim, IL;
Dileep Agnihotri, Round Rock, TX (US);
Tachi Rafaeli, Givat Shimshit, IL;
Boris Yokhin, Nazareth Illit, IL;
David Berman, Kiryat Tivon, IL;
Asher Peled, Kfar Vradim, IL;
Dileep Agnihotri, Round Rock, TX (US);
Tachi Rafaeli, Givat Shimshit, IL;
Boris Yokhin, Nazareth Illit, IL;
Jordan Valley Applied Radiation Ltd., Migdal Ha'emek, IL;
Abstract
A method for inspection of a sample includes irradiating the sample with a beam of X-rays and measuring a distribution of the X-rays that are emitted from the sample responsively to the beam, thereby generating an X-ray spectrum. An assessment is made of an effect on the spectrum of a non-uniformity of the beam, and the spectrum is corrected responsively to the effect.