Moshav Zippori, Israel

Amos Gvirtzman


Average Co-Inventor Count = 3.9

ph-index = 9

Forward Citations = 582(Granted Patents)


Location History:

  • Zippori, IL (2000)
  • Moshav Zippori, IL (2002 - 2014)

Company Filing History:


Years Active: 2000-2014

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12 patents (USPTO):Explore Patents

Title: The Innovations of Amos Gvirtzman: Pioneering High-Resolution X-ray Diffraction

Introduction: Amos Gvirtzman, a talented inventor residing in Moshav Zippori, Israel, has made significant contributions to the field of measurement technologies. With a total of 12 patents to his name, Gvirtzman has demonstrated a strong commitment to enhancing analytical methods through innovative approaches.

Latest Patents: Among his latest inventions is a method for high-resolution X-ray diffraction measurement with enhanced sensitivity. This groundbreaking technique involves directing a converging beam of X-rays toward a sample surface that has an epitaxial layer. Gvirtzman’s method allows for the sensing of diffracted X-rays, which are then resolved as a function of angle to generate a detailed diffraction spectrum. This spectrum includes distinctive diffraction peaks and fringes due to the epitaxial layer, enabling a characteristic analysis of these fringes to measure the relaxation of the epitaxial layer. This innovation signifies a major advancement in the precision of X-ray diffraction measurements.

Career Highlights: Throughout his career, Gvirtzman has been associated with reputable companies such as Jordan Valley Applied Radiation Ltd. and Jordan Valley Semiconductor Ltd. His work in these organizations has been pivotal in the development of advanced measurement techniques and technologies.

Collaborations: During his journey as an inventor, Gvirtzman has collaborated with several notable professionals in his field, including Boris Yokhin and Isaac Mazor. These partnerships have fostered an environment of creativity and have significantly contributed to the success of his innovative projects.

Conclusion: Amos Gvirtzman exemplifies the spirit of innovation in the realm of analytical technologies. His ongoing efforts to refine high-resolution X-ray diffraction measurement techniques are paving the way for future advancements. With 12 patents under his belt and a reputable career, Gvirtzman continues to inspire fellow inventors and researchers in pursuing new horizons in measurement science.

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