The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2004
Filed:
Feb. 19, 2002
Applicant:
Inventors:
Assignee:
Jordan Valley Applied Radiation Ltd., Migdal Haemek, IL;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/320 ;
U.S. Cl.
CPC ...
G01N 2/320 ;
Abstract
A method for testing a surface includes finding respective first and second critical angles for total external reflection of radiation from an area of the surface at first and second wavelengths. The first and second critical angles are compared to determine an orientation of a tangent to the surface in the area.