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For the Inventor, By the Inventor

Heimstetten, Germany

Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh

Calculating rank
USPTO Granted Patents = 168

% Expired Patents = 3.0


Trademarks = 1

Forward Citations = 1,137

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77 inventors (with patents filed for the assignee):

goldMedal Dieter Winkler (38 out of 54 patents)

silverMedal Pavel Adamec (33 out of 44 patents)

bronzeMedal Jürgen Frosien (32 out of 61 patents)

4.  Stefan Lanio (27 out of 39 patents)

5.  Juergen Frosien (21 out of 43 patents)

6.  John Breuer (20 out of 20 patents)

7.  Benjamin John Cook (18 out of 19 patents)

8.  Matthias Firnkes (15 out of 15 patents)

9.  Hans-Peter Feuerbaum (12 out of 37 patents)

10.  Ralf Degenhardt (9 out of 10 patents)

11.  Dominik Patrick Ehberger (8 out of 8 patents)

12.  Helmut Banzhof (7 out of 10 patents)

13.  Florian Lampersberger (5 out of 5 patents)

14.  Carlo Salvesen (5 out of 5 patents)

15.  Thomas Jasinski (5 out of 7 patents)


Core Competencies:
Charged Particle Beam
Beam Manipulation
Aberration Correction
Multipole Device
Electron Beam
Imaging Device
Inspection System
Brightness Measurement
Multi-Beam System
Signal Detection
Optics
Field Emitter

168 patents:

1. 12755923 - Deflector for a charged particle beam apparatus, deflecting system, charged particle beam apparatus, and method of fabricating a deflector (2026-10-06),
2. 12749645 - Method of characterizing a detection path of a charged particle beam and a charged particle mirror (2026-09-29),
3. 12695050 - Method of determining a beam convergence of a charged particle beam, and charged particle beam system (2026-07-28),
4. 12658402 - Magnetic multipole device, charged particle beam apparatus, and method of influencing a charged particle beam propagating along an optical axis (2026-06-16),
5. 12658401 - Proximity-electrode, charged particle beam device and method for inspecting and/or imaging a sample (2026-06-16),
6. 12633489 - Electron beam apparatus, foil or grid lens, and method of operating an electron beam apparatus (2026-05-19),
7. 12626881 - Aberration corrector, a charged particle beam apparatus, a method of aligning an aberration corrector and a method of correcting aberration of a charged particle beam (2026-05-12),
8. 12562338 - Method of determining an energy spectrum or energy width of a charged particle beam, and charged particle beam imaging device (2026-02-24),
9. 12542253 - Charged particle optics, charged particle beam apparatus, and method for scanning a charged particle beam (2026-02-03),
10. 12451322 - Method of forming a multipole device, method of influencing an electron beam, and multipole device (2025-10-21),
11. 12412727 - Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereof (2025-09-09),
12. 12386164 - Method of determining a brightness of a charged particle beam, method of determining a size of a source of the charged particle beam, and charged particle beam imaging device (2025-08-12),
13. 12308203 - Methods of determining aberrations of a charged particle beam, and charged particle beam system (2025-05-20),
14. 11817292 - Primary charged particle beam current measurement (2023-11-14),
15. 11810753 - Methods of determining aberrations of a charged particle beam, and charged particle beam system (2023-11-07),
Company Overview
Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh, based in Heimstetten, Germany, specializes in advanced technologies related to charged particle beam applications. The company focuses on the development and manufacturing of sophisticated inspection systems and imaging devices, utilizing techniques such as beam manipulation and aberration correction. Their expertise extends to multipole devices and brightness measurement, catering to the semiconductor industry and enhancing the precision of integrated circuit testing.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

168 Patents

#1 in Heimstetten

#360 in Germany

#4,926 in the World

Heimstetten, DE
Heimstetten, Germany

Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh

Forward Citations = 1,137

77 inventors:

goldMedal Dieter Winkler (38 out of 54 patents)

silverMedal Pavel Adamec (33 out of 44 patents)

bronzeMedal Jürgen Frosien (32 out of 61 patents)

4.  Stefan Lanio (27 out of 39 patents)

5.  Juergen Frosien (21 out of 43 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh. Retrieved from https://idiyas.com/company/ict-integrated-circuit-testing-gesellschaft-fur-halbleiterpruftechnik-mbh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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