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Heimstetten, Germany

Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh

USPTO Granted Patents = 156

EPO Patents = 80

Trademarks = 1

Forward Citations = 1,059

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70 inventors (with patents filed for the assignee):

Dieter Winkler (36 out of 54 patents)

Jürgen Frosien (32 out of 61 patents)

Pavel Adamec (32 out of 43 patents)

4. Stefan Lanio (27 out of 39 patents)

5. Juergen Frosien (21 out of 43 patents)

6. John Breuer (16 out of 16 patents)

7. Benjamin John Cook (16 out of 17 patents)

8. Matthias Firnkes (14 out of 14 patents)

9. Hans-Peter Feuerbaum (11 out of 37 patents)

10. Ralf Degenhardt (9 out of 10 patents)

11. Helmut Banzhof (7 out of 10 patents)

12. Dominik Patrick Ehberger (6 out of 6 patents)

13. Carlo Salvesen (5 out of 5 patents)

14. Thomas Jasinski (5 out of 7 patents)

15. Ivo Liska (5 out of 5 patents)

Core Competencies:

Charged Particle Beam

Aberration Correction

Electron Beam

Multipole Device

Scanning Electron Microscope

Beam Blanking Device

Multi-Beam Assembly

Signal Charged Particle Detection

Thermal Field Emitter

High Performance Inspection

Electrostatic Multipole Arrangement

Secondary Charged Particle Imaging

156 patents: Sort by Forward Citations

1. 12451322 - Method of forming a multipole device, method of influencing an electron beam, and multipole device (2025-10-21),

2. 12412727 - Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereof (2025-09-09),

3. 12386164 - Method of determining a brightness of a charged particle beam, method of determining a size of a source of the charged particle beam, and charged particle beam imaging device (2025-08-12),

4. 12308203 - Methods of determining aberrations of a charged particle beam, and charged particle beam system (2025-05-20),

5. 11817292 - Primary charged particle beam current measurement (2023-11-14),

6. 11810753 - Methods of determining aberrations of a charged particle beam, and charged particle beam system (2023-11-07),

7. 11791128 - Method of determining the beam convergence of a focused charged particle beam, and charged particle beam system (2023-10-17),

8. 11705301 - Charged particle beam manipulation device and method for manipulating charged particle beamlets (2023-07-18),

9. 11545338 - Charged particle beam apparatus and method of controlling sample charge (2023-01-03),

10. 11501947 - Aberration corrector and method of aligning aberration corrector (2022-11-15),

11. 11501946 - Method of influencing a charged particle beam, multipole device, and charged particle beam apparatus (2022-11-15),

12. 11495433 - Charged particle beam apparatus, multi-beamlet assembly, and method of inspecting a specimen (2022-11-08),

13. 11469072 - Charged particle beam apparatus, scanning electron microscope, and method of operating a charged particle beam apparatus (2022-10-11),

14. 11257657 - Charged particle beam device with interferometer for height measurement (2022-02-22),

15. 11239043 - Charged particle beam device and method for inspecting and/or imaging a sample (2022-02-01),

ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH is a leading provider of testing solutions for integrated circuits. With cutting-edge technology and expertise, the company offers a comprehensive range of services, including wafer testing, final IC testing, and failure analysis. ICT's innovative solutions ensure the highest quality and reliability of ICs, meeting the demands of various industries such as automotive, telecommunications, and consumer electronics. Visit their website for more information and to discover how ICT can help meet your IC testing needs.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

156 Patents

#1 in Heimstetten

#419 in Germany

#5,117 in the World

Heimstetten, Germany

Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh

Forward Citations = 1,059

70 inventors:

Dieter Winkler (36 out of 54 patents)

Jürgen Frosien (32 out of 61 patents)

Pavel Adamec (32 out of 43 patents)

4. Stefan Lanio (27 out of 39 patents)

5. Juergen Frosien (21 out of 43 patents)

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