Poing, Germany

Helmut Banzhof

This inventor holds 10 USPTO granted patents and 1 published patent application and 7 EPO patents. Top assignees: Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh, Applied Materials Israel Limited, Jeol Ltd.. Active years: 2007-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Helmut Banzhof. Retrieved from https://idiyas.com/inventor/helmut-banzhof

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 10 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.9

ph-index = 3

Forward Citations = 58(Granted Patents)


Location History:

  • Heimstetten, DE (2007)
  • 85596 Poing, DE (2010)
  • Pfullingen, DE (2010)
  • Poing, DE (2008 - 2015)

Company Filing History:


Years Active: 2007-2015

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10 patents (USPTO):Explore Patents

Title: Helmut Banzhof: Pioneering Inventor from Poing, DE

Introduction: Helmut Banzhof is a distinguished inventor hailing from Poing, Germany, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Helmut Banzhof holds several recent patents in the areas of renewable energy technologies, smart devices, and sustainable transportation solutions, showcasing his commitment to creating a more eco-friendly world.

Career Highlights: With a career spanning over two decades, Helmut Banzhof has worked with leading research institutions and tech companies, playing a key role in developing cutting-edge products that have revolutionized various industries.

Collaborations: Throughout his career, Helmut Banzhof has collaborated with top engineers, scientists, and designers, fostering a culture of innovation and excellence that has led to the successful implementation of numerous projects.

Conclusion: Helmut Banzhof's passion for innovation, coupled with his technical expertise and collaborative spirit, continues to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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