Riemerling, Germany

Jürgen Frosien

USPTO Granted Patents = 61 

 

Average Co-Inventor Count = 1.7

ph-index = 13

Forward Citations = 497(Granted Patents)

Forward Citations (Not Self Cited) = 481(Dec 10, 2025)


Location History:

  • Berlin, DE (1979 - 1981)
  • Ottobrunn, DE (1986 - 1993)
  • Heimstetten, DE (1995)
  • Riemering, DE (2009)
  • Riemerling, DE (1997 - 2020)

Company Filing History:


Years Active: 1979-2025

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Areas of Expertise:
Charged Particle Beam Device
Multi-Beam Lens Device
Electron Beam Inspection
High Resolution Imaging
Beam Separator Device
Particle Beam Apparatus
Electron Gun Technology
Surface Imaging Techniques
Deflection Arrangement
Energy Width Reduction
Focusing Lens Design
Sample Processing Methods
61 patents (USPTO):Explore Patents

Title: Innovator Spotlight: Jürgen Frosien – Pioneering Advances in Particle Emission Technology

Introduction: Jürgen Frosien, a notable inventor based in Riemerling, Germany, has made significant contributions to the field of charged particle beam technology with an impressive portfolio of 31 patents. His innovative designs and methodologies have paved the way for advancements in various applications, particularly in semiconductor testing and imaging technologies.

Latest Patents: Among his latest patents are two groundbreaking inventions: the "Simplified Particle Emitter and Method of Operating Thereof" and the "Device and Method for Forming a Plurality of Charged Particle Beamlets." The former patent details an emitter assembly configured for generating a charged particle beam aligned parallel to an optical axis. It emphasizes a unique biasing method involving an emitter tip and extractor set at precise distances to optimize performance. Conversely, the latter patent describes a charged particle beam device capable of creating multiple focused beamlets. This innovation involves directing charged particles through specialized apertures, effectively minimizing beam aberrations and enhancing focus for various applications.

Career Highlights: Jürgen Frosien has worked with prominent firms such as ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH, where he developed and tested advanced semiconductor technologies. His expertise has played a crucial role in the evolution of testing procedures and ensuring the accuracy of semiconductor devices, thus driving quality and performance standards.

Collaborations: Throughout his career, Jürgen has collaborated with talented colleagues, including Stefan Lanio and Benjamin John Cook. Together, these professionals have combined their expertise to enhance the development and implementation of innovative testing technologies, thereby contributing to the advancement of the industry.

Conclusion: Jürgen Frosien stands out as a visionary inventor whose work in particle emission technology remains influential. His latest patents exemplify his commitment to innovation, and his collaborations with esteemed colleagues reflect the importance of teamwork in driving technological advancements. As the field evolves, Jürgen's contributions will undoubtedly shape future developments in charged particle beam applications.

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