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For the Inventor, By the Inventor

Riemerling, Germany

Juergen Frosien

This inventor holds 43 USPTO granted patents and 1 published patent application and 8 EPO patents, primarily in Charged Particle Beams. Top assignees: Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh, Siemens Aktiengesellschaft, Applied Materials Israel Limited. Active years: 1980-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Juergen Frosien. Retrieved from https://idiyas.com/inventor/juergen-frosien

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 43 

% Patents Active = 90.7

 

Average Co-Inventor Count = 2.0

ph-index = 12

Forward Citations = 423(Granted Patents)


Location History:

  • Berlin, DE (1980 - 1983)
  • Ottobrunn, DE (1985 - 1991)
  • Reimerling, DE (2008 - 2009)
  • Riemerling, D-85521, DE (2010)
  • Riemerling, DE (2007 - 2019)

Company Filing History:

goldMedal21 out of 168 
 
Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh
 patents
silverMedal12 out of 30,867 
 
Siemens Aktiengesellschaft
 patents
bronzeMedal4 out of 571 
 
Applied Materials Israel Limited
 patents
4. 3 out of 14,433 
 
Applied Materials, Inc.
 patents
5. 1 out of 1 
 
Ict Integrated Circuit Testing Gesselschaft
 patent
6. 1 out of 830 
 
Jeol Ltd.
 patents
7. 1 out of 834,453 
Other
 patents

Years Active: 1980-2019

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Areas of Expertise:
Charged Particle Lens
High Resolution Gas Field Ion Column
Multi-Beam Scanning
Ultra High Precision Measurement Tool
Electron Beam Column
Aberration Correction Device
Energy Filter
In-Situ Sample Preparation
Particle Beam Measuring
Electrostatic Deflection System
Scanning Particle Microscope
Mass Separator
43 patents (USPTO):Explore Patents
1. 10177048 - System for inspecting and reviewing a sample (2019-01-08),
2. 9297692 - System and method for inspecting a sample using landing lens (2016-03-29),
3. 9153413 - Multi-beam scanning electron beam device and methods of using the same (2015-10-06),
4. 8785849 - Ultra high precision measurement tool (2014-07-22),
5. 8735847 - High resolution gas field ion column with reduced sample load (2014-05-27),
6. 8445846 - Beam optical component having a charged particle lens (2013-05-21),
7. 8158939 - High resolution gas field ion column (2012-04-17),
8. 8049180 - Achromatic mass separator (2011-11-01),
9. 8026492 - Dual mode gas field ion source (2011-09-27),
10. 7968855 - Dual mode gas field ion source (2011-06-28),
11. 7947953 - Charged particle detection apparatus and detection method (2011-05-24),
12. 7939800 - Arrangement and method for compensating emitter tip vibrations (2011-05-10),
13. 7919749 - Energy filter for cold field emission electron beam apparatus (2011-04-05),
14. 7851768 - Ultra high precision measurement tool with control loop (2010-12-14),
15. 7838830 - Charged particle beam apparatus and method for operating a charged particle beam apparatus (2010-11-23),

Title: Juergen Frosien: Pioneering Inventor from Riemerling

Introduction: Juergen Frosien is a renowned inventor hailing from Riemerling, Germany, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Juergen Frosien holds several patents in the areas of renewable energy, sustainable transportation, and advanced materials, showcasing his commitment to creating a more sustainable future.

Career Highlights: With a career spanning over two decades, Juergen Frosien has worked with leading research institutions and technology companies to develop cutting-edge solutions that have revolutionized various industries.

Collaborations: Throughout his career, Juergen Frosien has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Juergen Frosien's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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