The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Feb. 20, 2013
Applicant:

Applied Materials Israel, Ltd., Rehovot, IL;

Inventors:

Yoram Uziel, Misgav, IL;

Alon Litman, Nes-Ziona, IL;

Ofer Adan, Rehovot, IL;

Ron Naftali, Shoham, IL;

Juergen Frosien, Riemerling, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/02 (2006.01); G01J 1/04 (2006.01); G01N 21/88 (2006.01); G02B 21/00 (2006.01); G02B 21/24 (2006.01); G01N 21/95 (2006.01); G01N 21/956 (2006.01); G02B 13/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0266 (2013.01); G01J 1/0422 (2013.01); G01N 21/8806 (2013.01); G02B 21/0016 (2013.01); G02B 21/24 (2013.01); G01N 21/9501 (2013.01); G01N 21/956 (2013.01); G02B 13/001 (2013.01);
Abstract

An evaluation system that includes a miniature module that comprises a miniature objective lens and a miniature supporting module; wherein the miniature supporting module is arranged, when placed on a sample, to position the miniature objective lens at working distance from the sample; wherein the miniature objective lens is arranged to gather radiation from an area of the sample when positioned at the working distance from the sample; a sensor arranged to detect radiation that is gathered by the miniature objective lens to provide detection signals indicative of the area of the sample.


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