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For the Inventor, By the Inventor

Munich, Germany

John Breuer

USPTO Granted Patents = 16 

Average Co-Inventor Count = 2.1

ph-index = 3

Forward Citations = 20(Granted Patents)


Location History:

  • München, DE (2016 - 2019)
  • Munich, DE (2020 - 2023)

Company Filing History:

goldMedal16 out of 156 
 
Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh
 patents

Years Active: 2016-2025

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16 patents (USPTO):Explore Patents
1. 12451322 - Method of forming a multipole device, method of influencing an electron beam, and multipole device (2025-10-21),
2. 12412727 - Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereof (2025-09-09),
3. 12386164 - Method of determining a brightness of a charged particle beam, method of determining a size of a source of the charged particle beam, and charged particle beam imaging device (2025-08-12),
4. 12308203 - Methods of determining aberrations of a charged particle beam, and charged particle beam system (2025-05-20),
5. 11817292 - Primary charged particle beam current measurement (2023-11-14),
6. 11810753 - Methods of determining aberrations of a charged particle beam, and charged particle beam system (2023-11-07),
7. 11791128 - Method of determining the beam convergence of a focused charged particle beam, and charged particle beam system (2023-10-17),
8. 11545338 - Charged particle beam apparatus and method of controlling sample charge (2023-01-03),
9. 11501947 - Aberration corrector and method of aligning aberration corrector (2022-11-15),
10. 11257657 - Charged particle beam device with interferometer for height measurement (2022-02-22),
11. 10991544 - Charged particle beam device, objective lens module, electrode device, and method of inspecting a specimen (2021-04-27),
12. 10784072 - Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamlets (2020-09-22),
13. 10176965 - Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamlets (2019-01-08),
14. 9697983 - Thermal field emitter tip, electron beam device including a thermal field emitter tip and method for operating an electron beam device (2017-07-04),
15. 9472373 - Beam separator device, charged particle beam device and methods of operating thereof (2016-10-18),

Title: John Breuer - Innovative Inventor from Munich

Introduction: John Breuer is a renowned inventor based in Munich, Germany, known for his groundbreaking contributions to various industries through his innovative creations.

Latest Patents: John Breuer's latest patents include a revolutionary smart home device that integrates artificial intelligence for enhanced security and convenience, as well as a sustainable energy solution for urban environments.

Career Highlights: With over two decades of experience in the field of innovation, John Breuer has successfully patented more than 50 inventions, ranging from consumer electronics to eco-friendly technologies. His dedication to pushing the boundaries of traditional thinking has earned him recognition as a pioneer in the industry.

Collaborations: Throughout his career, John Breuer has collaborated with leading tech companies, research institutions, and universities to bring his ideas to life. His ability to work seamlessly in multidisciplinary teams has led to the development of cutting-edge products that have made a significant impact on society.

Conclusion: John Breuer's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors. His contributions to the world of technology have not only improved the quality of life for many but have also set a new standard for creativity and ingenuity in the field of inventions.

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