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USPTO Data Jan 1 1976 - Oct 20 2026
10 Patents
#1 in Kagawa Prefecture
#4,404 in Japan
#56,092 in the World
Futec Inc.
Forward Citations = 194
13 inventors:
Futec Inc.
% Expired Patents = 10.0
EPO Patents = 1
Trademarks = 1
Forward Citations = 194
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13 inventors (with patents filed for the assignee):
Hideyuki Hanafusa (3 out of 3 patents)
Ryuji Ohnishi (2 out of 2 patents)
Masami Nishio (2 out of 2 patents)
4. Toshiro Mihara (2 out of 2 patents)
5. Yoshinori Kurokawa (1 out of 1 patent)
6. Mitsuaki Kameyama (1 out of 1 patent)
7. Kiyoshi Mizobuchi (1 out of 1 patent)
8. Joseph T Holden (1 out of 1 patent)
9. Tomio Yamamoto (1 out of 9 patents)
10. Isoshiro Ishida (1 out of 1 patent)
11. Kouji Seno (1 out of 1 patent)
12. Hirosato Yamane (1 out of 1 patent)
13. Shizuo Nishioka (1 out of 1 patent)
14. Yasunari Suzuki (8 patents)
15. Shinya Iori (7 patents)
10 patents:
Company Overview
Futec Inc., based in Kagawa Prefecture, Japan, specializes in the development and manufacturing of advanced optical and electronic components. The company focuses on innovative technologies that enhance performance in various applications, including telecommunications and industrial automation. With a commitment to research and development, Futec aims to deliver cutting-edge solutions that meet the evolving needs of its clients in a competitive global market.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Futec Inc.. Retrieved from https://idiyas.com/company/futec
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]