This inventor holds 1 USPTO granted patent. Top assignee: Futec Inc.. Active years: 1988.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1988
Title: Shizuo Nishioka: Innovator in Flaw Detection Technology
Introduction
Shizuo Nishioka is a notable inventor based in Takamatsu, Japan. He has made significant contributions to the field of flaw detection technology, particularly through his innovative patent that enhances the ability to identify flaws in various materials.
Latest Patents
Nishioka holds a patent for a flaw detector designed to identify imperfections in sheets. This advanced device utilizes multiple linear array cameras to capture light rays transmitted through a sheet. The processed video signals from these cameras are instrumental in determining the presence of flaws. A sensitivity-difference correcting section addresses variations in sensitivity among the cameras and their photosensitive elements. Additionally, automatic gain control sections manage the sensitivities of the video signals for both transparent and opaque flaws. The system differentiates these signals and compares them against a predetermined slicing level to ascertain the presence of flaws.
Career Highlights
Shizuo Nishioka is associated with Futec Inc., where he applies his expertise in developing cutting-edge technologies. His work has been pivotal in advancing the capabilities of flaw detection systems, making them more efficient and reliable.
Collaborations
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Conclusion
Shizuo Nishioka's contributions to flaw detection technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to improving quality control processes across various industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile