The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 1990

Filed:

Jun. 17, 1988
Applicant:
Inventor:

Ryuji Ohnishi, Takamatsu, JP;

Assignee:

Futec Inc., Takamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-8 ; 356237 ; 358106 ; 382 34 ; 382 47 ;
Abstract

A method of detecting a significant difference of a to-be-checked sheet includes the steps of: scanning a traveling to-be-checked sheet by a camera in the widthwise direction to obtain image data, extracting an outline of an image and an outline of a defect on the to-be-checked sheet from the image data, sequentially writing the outline data extracted in the outline extraction step in a memory with a predetermined cycle in accordance with travel position data and simultaneously reading out the outline data, comparing outline pattern data for an immediately preceding cycle as outline mask data with the latest outline pattern data obtained in a cycle following the immediately preceding cycle, and detecting a significant difference between the outline mask data and the latest outline pattern data in accordance with the comparison result obtained in the comparison step.


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