The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
Feb. 25, 2002
Kiyoshi Mizobuchi, Kagawa-gun, JP;
Mitsuaki Kameyama, Takamatsu, JP;
Yoshinori Kurokawa, Yokohama, JP;
Futec Inc., Kagawa Prefecture, JP;
Abstract
A thickness-measuring device comprising (i) an X-ray tube unit including an X-ray tube, (ii) an X-ray detector unit including an X-ray detector having a sensor, and (iii) a means for driving the X-ray tube unit and the X-ray detector unit back and forth, in synchronism with each other, widthwise of an object whose thickness is measured and which runs through a pathline between the X-ray tube unit and the X-ray detector unit. A mask is set above the sensor of the X-ray detector to cover it partly; accordingly, the light-receiving area of the light receiver of the X-ray detector is smaller than the whole area of the sensor. Thus, the measuring area per unit time is reduced effectively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile