The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 1994
Filed:
Sep. 17, 1992
Hideyuki Hanafusa, Takamatsu, JP;
Masami Nishio, Kagawa, JP;
Futec Inc., Takamatsu, JP;
Abstract
A method of displaying a defect appearing on an elongated object conveyed in one direction. The method comprises the steps of scanning the object in the width direction thereof by means of a sensor camera, and obtaining object image data corresponding to the object, processing the object image data, to detect a defect in the object, storing the object image data in an image memory in a scroll manner, stopping the scroll storing of the object image data in the image memory and storing the object image data output subsequently from the sensor camera in the other image memory in response to the detection of the defect, and retaining the object image data including the defect in the image memories as still image data, and displaying the still image data read out from the image memories on a monitor screen as a still image such that the defect is displayed at a predetermined position on the monitor screen.