This inventor holds 3 USPTO granted patents. Top assignees: Futec Inc., Kawasaki Steel Corporation. Active years: 1980-1994.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1980-1994
Title: **The Innovative Mind of Hideyuki Hanafusa**
Introduction
Hideyuki Hanafusa, an accomplished inventor based in Takamatsu, Japan, has made significant contributions to the field of defect detection in various materials. With three patents to his name, his work demonstrates a keen understanding of both technology and its practical applications.
Latest Patents
Hanafusa's latest patents include a **Method and Apparatus for Displaying Defect in Central Area of Monitor**. This innovative method detects defects on elongated objects being conveyed, utilizing a sensor camera to scan the object's width, process the image data, and retain images with detected defects for display on a monitor at a predetermined position. Another notable patent is the **Method and Apparatus for Detection of Surface Defects of Hot Metal Body**. This technology focuses on detecting surface defects in hot-rolled steel sheets by integrating video signals derived from both the metal's radiation and externally projected light, significantly reducing false detections caused by noise signals.
Career Highlights
Hanafusa has honed his skills and expertise while working with esteemed companies like Futec Inc. and Kawasaki Steel Corporation. His experience in these organizations has undoubtedly shaped his innovative approaches and technical capabilities.
Collaborations
Throughout his career, Hanafusa has collaborated with a talented team, including associates such as Hirosato Yamane and Masami Nishio. Their collective efforts have contributed to the advancement of inspection technologies, showcasing the importance of teamwork in the development of groundbreaking inventions.
Conclusion
Hideyuki Hanafusa's inventive spirit and dedication to improving defect detection methods underscore his role as a key figure in innovation. With a focus on practical solutions for industry challenges, his work continues to pave the way for advancements in material inspection technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile