Company Filing History:
Years Active: 1993-1994
Title: Masami Nishio: Innovator in Defect Detection Technology
Introduction
Masami Nishio is a notable inventor based in Kagawa, Japan. He has made significant contributions to the field of defect detection technology, holding 2 patents that showcase his innovative approaches. His work focuses on methods and apparatuses that enhance the accuracy and efficiency of defect identification in various applications.
Latest Patents
Nishio's latest patents include a "Method and apparatus for displaying defect in central area of monitor." This invention outlines a method for displaying defects on elongated objects conveyed in one direction. The process involves scanning the object with a sensor camera, obtaining image data, detecting defects, and displaying the still image data on a monitor screen at a predetermined position. Another significant patent is the "Method of matching patterns and apparatus therefor." This method includes steps for optically scanning images, extracting outline data, and determining defects based on the comparison of master and to-be-recognized images.
Career Highlights
Masami Nishio is currently associated with Futec Inc., where he continues to develop innovative solutions in defect detection. His work has been instrumental in advancing technologies that improve quality control processes in various industries.
Collaborations
Nishio collaborates with Hideyuki Hanafusa, who is also a key contributor to their projects. Together, they work on enhancing the capabilities of defect detection technologies.
Conclusion
Masami Nishio's contributions to defect detection technology through his patents and collaborations highlight his role as an influential inventor in the field. His innovative methods continue to pave the way for advancements in quality control and image processing.