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For the Inventor, By the Inventor

Hillsboro, OR, United States of America

Fei Comapny


USPTO Granted Patents = 806



Trademarks = 13

Forward Citations = 4,005

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742 inventors (with patents filed for the assignee):

goldMedal Peter Christiaan Tiemeijer (42 out of 44 patents)

silverMedal Alexander Henstra (39 out of 46 patents)

bronzeMedal Mark Utlaut (37 out of 37 patents)

4.  Bart Buijsse (34 out of 36 patents)

5.  Pavel Potocek (30 out of 31 patents)

6.  Clive D Chandler (26 out of 55 patents)

7.  Milos Toth (26 out of 27 patents)

8.  Stacey Stone (25 out of 25 patents)

9.  N William Parker (25 out of 27 patents)

10.  Bart Jozef Janssen (23 out of 23 patents)

11.  Pleun Dona (23 out of 24 patents)

12.  Cornelis Sander Kooijman (22 out of 23 patents)

13.  Thomas Gary Miller (22 out of 22 patents)

14.  Steven J Randolph (21 out of 23 patents)

15.  Jeffrey Blackwood (21 out of 24 patents)


Core Competencies:
Cryo Electron Microscopy
Charged Particle Sensors
Scanning Transmission Electron Microscopy
Modular Ultra-High Vacuum Electron Microscope
Image Segmentation
Artificial Intelligence Metrology
3D Reconstruction Techniques
Beam Position Determination
Dynamic Spectral Acquisition
Automated Sample Alignment
Broad Ion Beam Systems
Liquid Metal Ion Source

806 patents:

1. 12531204 - Microscope aberration correction (2026-01-20),
2. 12531203 - Techniques for imaging low duty cycle signals using a scanning electron microscope (2026-01-20),
3. 12529724 - Capacitance-based detection of probe contact (2026-01-20),
4. 12525427 - Transmission charged particle beam apparatus, and method of aligning such a transmission charged particle beam apparatus (2026-01-13),
5. 12525422 - Charged particle optics components and their fabrication (2026-01-13),
6. 12525420 - Charged particle beam source (2026-01-13),
7. 12512293 - Reduction of image drift in a microscopy system (2025-12-30),
8. 12505996 - EELS auto-alignment using full image simulation (2025-12-23),
9. 12505975 - Focused ion beam system and method (2025-12-23),
10. 12488957 - Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy applications (2025-12-02),
11. 12476074 - Charged particle sensors including wide bandgap materials (2025-11-18),
12. 12463009 - Method and system for studying samples using a scanning transmission charged particle microscope with reduced beam induced sample damage (2025-11-04),
13. 12456186 - Method and system for preparing wedged lamella (2025-10-28),
14. 12444569 - Endpointing with determination of remaining distance (2025-10-14),
15. 12444022 - Focus stacking applications for sample preparation (2025-10-14),
FEI Company is a leading provider of electron microscopy solutions for materials science, life sciences, and electronics industries. They offer a wide range of high-performance imaging and analysis tools that enable scientists and researchers to visualize and characterize nanoscale structures and phenomena. With their advanced technology and innovative solutions, FEI Company helps advance scientific breakthroughs and accelerate the development of new materials and technologies.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Jan 20 2026

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806 Patents

#1 in Hillsboro, OR

#5 in Oregon

#606 in US

#1,212 in the World

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Hillsboro, OR, United States of America

Fei Comapny

Forward Citations = 4,005

742 inventors:

goldMedal Peter Christiaan Tiemeijer (42 out of 44 patents)

silverMedal Alexander Henstra (39 out of 46 patents)

bronzeMedal Mark Utlaut (37 out of 37 patents)

4.  Bart Buijsse (34 out of 36 patents)

5.  Pavel Potocek (30 out of 31 patents)

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