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Hillsboro, OR, United States of America

Fei Comapny

USPTO Granted Patents = 800

CIPO Patents = 1

EPO Patents = 299

Trademarks = 13

Forward Citations = 4,003

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736 inventors (with patents filed for the assignee):

Peter Christiaan Tiemeijer (42 out of 44 patents)

Alexander Henstra (38 out of 45 patents)

Mark Utlaut (37 out of 37 patents)

4. Bart Buijsse (34 out of 36 patents)

5. Pavel Potocek (30 out of 31 patents)

6. Clive D Chandler (26 out of 55 patents)

7. Milos Toth (26 out of 27 patents)

8. Stacey Stone (25 out of 25 patents)

9. N William Parker (25 out of 27 patents)

10. Bart Jozef Janssen (23 out of 23 patents)

11. Pleun Dona (23 out of 24 patents)

12. Cornelis Sander Kooijman (22 out of 23 patents)

13. Thomas Gary Miller (22 out of 22 patents)

14. Jeffrey Blackwood (21 out of 24 patents)

15. Chad Rue (21 out of 28 patents)

Core Competencies:

Cryo Electron Microscopy

Charged Particle Sensors

Scanning Transmission Electron Microscopy

Modular Ultra-High Vacuum Electron Microscope

Image Segmentation

Artificial Intelligence Metrology

3D Reconstruction Techniques

Beam Position Determination

Dynamic Spectral Acquisition

Automated Sample Alignment

Broad Ion Beam Systems

Liquid Metal Ion Source

800 patents: Sort by Forward Citations

1. 12512293 - Reduction of image drift in a microscopy system (2025-12-30),

2. 12505996 - EELS auto-alignment using full image simulation (2025-12-23),

3. 12505975 - Focused ion beam system and method (2025-12-23),

4. 12488957 - Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy applications (2025-12-02),

5. 12476074 - Charged particle sensors including wide bandgap materials (2025-11-18),

6. 12463009 - Method and system for studying samples using a scanning transmission charged particle microscope with reduced beam induced sample damage (2025-11-04),

7. 12456186 - Method and system for preparing wedged lamella (2025-10-28),

8. 12444569 - Endpointing with determination of remaining distance (2025-10-14),

9. 12444022 - Focus stacking applications for sample preparation (2025-10-14),

10. 12431322 - System and method for handling samples for study in a charged particle apparatus, such as a transmission electron microscope (2025-09-30),

11. 12431320 - Modular ultra-high vacuum electron microscope (2025-09-30),

12. 12423772 - Systems and methods for hybrid enhancement of scanning electron microscope images (2025-09-23),

13. 12417645 - Multiple image segmentation and/or multiple dynamic spectral acquisition for material and mineral classification (2025-09-16),

14. 12411099 - Systems and methods for detecting beam displacement (2025-09-09),

15. 12394587 - Simple spherical aberration corrector for SEM (2025-08-19),

FEI Company is a leading provider of electron microscopy solutions for materials science, life sciences, and electronics industries. They offer a wide range of high-performance imaging and analysis tools that enable scientists and researchers to visualize and characterize nanoscale structures and phenomena. With their advanced technology and innovative solutions, FEI Company helps advance scientific breakthroughs and accelerate the development of new materials and technologies.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

800 Patents

#1 in Hillsboro, OR

#5 in Oregon

#613 in US

#1,220 in the World

Hillsboro, OR, United States of America

Fei Comapny

Forward Citations = 4,003

736 inventors:

Peter Christiaan Tiemeijer (42 out of 44 patents)

Alexander Henstra (38 out of 45 patents)

Mark Utlaut (37 out of 37 patents)

4. Bart Buijsse (34 out of 36 patents)

5. Pavel Potocek (30 out of 31 patents)

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