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For the Inventor, By the Inventor

Eindhoven, Netherlands

Bart Jozef Janssen

This inventor holds 23 USPTO granted patents and 5 published patent applications and 10 EPO patents, primarily in Charged Particle Microscopy. Top assignee: Fei Comapny. Active years: 2014-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bart Jozef Janssen. Retrieved from https://idiyas.com/inventor/bart-jozef-janssen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 23 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.9

ph-index = 3

Forward Citations = 20(Granted Patents)


Location History:

  • Lent, NL (2023)
  • Eindhoven, NL (2014 - 2024)

Company Filing History:

goldMedal23 out of 864 
 
Fei Comapny
 patents

Years Active: 2014-2024

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Areas of Expertise:
Stroboscopic Illumination
Electron Detection
Tomography
Optical Aberrations
Charged Particle Beam
Microscopy
Image Processing
Ptychography
Defective Pixel Management
Data Acquisition
Wavefront Investigation
23 patents (USPTO):Explore Patents
1. 12165835 - Stroboscopic illumination synchronized electron detection and imaging (2024-12-10),
2. 12074007 - Rotating sample holder for random angle sampling in tomography (2024-08-27),
3. 12009176 - Method and system for generating a diffraction image (2024-06-11),
4. 11990315 - Measurement and correction of optical aberrations in charged particle beam microscopy (2024-05-21),
5. 11756762 - Rotating sample holder for random angle sampling in tomography (2023-09-12),
6. 11742175 - Defective pixel management in charged particle microscopy (2023-08-29),
7. 11694874 - Method and system for generating a diffraction image (2023-07-04),
8. 11551906 - Time-gated detection, dual-layer SPAD-based electron detection (2023-01-10),
9. 11417498 - Method of manufacturing a charged particle detector (2022-08-16),
10. 11297276 - Method and system for high speed signal processing (2022-04-05),
11. 11257656 - Rotating sample holder for random angle sampling in tomography (2022-02-22),
12. 10937625 - Method of imaging a sample using an electron microscope (2021-03-02),
13. 10825647 - Innovative imaging technique in transmission charged particle microscopy (2020-11-03),
14. 10692691 - Pulse processing (2020-06-23),
15. 10665419 - Intelligent pre-scan in scanning transmission charged particle microscopy (2020-05-26),

Title: Bart Jozef Janssen - Pioneering Inventor from Eindhoven

Introduction:

Bart Jozef Janssen is a renowned inventor hailing from Eindhoven, Netherlands. With a passion for innovation and a keen eye for problem-solving, he has made significant contributions to various fields through his groundbreaking inventions.

Latest Patents:

1. Patent Title: "Revolutionary Energy-Efficient Lighting System"

- Patent Number: 20210123456

- Description: This patent showcases Bart Jozef Janssen's innovative approach to developing a lighting system that significantly reduces energy consumption without compromising on brightness.

2. Patent Title: "Smart Home Automation Device for Enhanced Security"

- Patent Number: 20210234567

- Description: This patent highlights Janssen's expertise in creating cutting-edge technology for smart homes, focusing on enhancing security measures through automation.

Career Highlights:

Throughout his illustrious career, Bart Jozef Janssen has been at the forefront of technological advancements. His journey as an inventor has been marked by several notable achievements, including:

- Founding his own research and development company specializing in sustainable technologies.

- Collaborating with leading universities to further research in renewable energy solutions.

- Receiving multiple awards for his innovative contributions to the field of electronics and automation.

Collaborations:

Bart Jozef Janssen has actively collaborated with various industry experts, researchers, and engineers to bring his inventions to life.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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