The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Jun. 30, 2023
Fei Company, Hillsboro, OR (US);
Maurits Diephuis, Hillsboro, OR (US);
Maurice Peemen, Hillsboro, OR (US);
Hans Irma Stefaan Vanrompay, Hillsboro, OR (US);
Narges Javaheri, Hillsboro, OR (US);
FEI Company, Hillsboro, OR (US);
Abstract
Disclosed herein are scientific-instrument support systems, as well as related methods, apparatus, computing devices, and computer-readable media. In some embodiments, a support apparatus for a scientific instrument includes an interface device and a processing device. The interface device receives Ronchigrams acquired with the scientific instrument and transmits control signals for the electron-beam optics thereof. The processing device converts a measured Ronchigram into an input token for a transformer, produces an output token based on a tokenized sentence ending with the input token, and determines adjustments to the control signals based on the input and output tokens. The input and output tokens belong to a plurality of tokens representing reference Ronchigrams sampling an alignment parameter space of the electron-beam optics. The transformer implements an autoregressive masked language model trained on a corpus of reference sentences representing paths through the alignment parameter space to a target alignment state of the electron-beam optics.