Hillsboro, OR, United States of America

N William Parker

This inventor holds 27 USPTO granted patents and 2 published patent applications and 10 EPO patents, primarily in Charged Particle Systems. Top assignees: Fei Comapny, Other. Active years: 2012-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: N William Parker. Retrieved from https://idiyas.com/inventor/n-william-parker

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 27 

% Patents Active = 96.3

 

Average Co-Inventor Count = 2.8

ph-index = 7

Forward Citations = 108(Granted Patents)


Company Filing History:


Years Active: 2012-2019

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Areas of Expertise:
X-Ray Targets
Electron Microscope
Charged Particle Beam
Ion Source
Plasma Source
Fluorescent Markers
Mass Filter
Optics Integration
High Voltage Isolation
Beam Systems
Light Detection
Rapid Gas Switching
27 patents (USPTO):Explore Patents

Title: The Innovative Journey of N William Parker

Introduction: N William Parker is a prominent inventor based in Hillsboro, Oregon, renowned for his contributions to the field of x-ray technology. With a total of 27 patents to his name, Parker has established himself as a key player in innovation and development, particularly in designing advanced x-ray targets and electron microscopy technology.

Latest Patents: Among Parker's latest inventions are two notable patents. The first is titled "High aspect ratio X-ray targets and uses of same," which presents an x-ray target comprising a substrate made from a soft x-ray producing material combined with a high aspect ratio structure made of hard x-ray producing material. This innovative design allows for the structure to be embedded, formed, or cantilevered from the substrate and includes a configuration to form a Hadamard matrix structure using multiple high aspect ratio structures arranged in grids or arrays. The second patent, "Electron microscope with multiple types of integrated x-ray detectors arranged in an array," describes an electron microscope featuring a vacuum chamber, an optics column, and multiple x-ray detectors positioned at various takeoff angles to enhance the counting efficiency for accurate x-ray detection. This configuration allows for an improved data gathering process through optimization techniques based on multiple takeoff angles.

Career Highlights: Throughout his career, Parker has been associated with several innovative companies, including FEI Company, a leader in electron microscopy and semiconductor technology. His work has significantly advanced the capabilities and applications of x-ray technology and electron microscopy, making substantial impacts in various fields.

Collaborations: N William Parker has collaborated with various capable professionals, including Mark Utlaut and Sean Kellogg. These collaborations have enriched his work, allowing for innovative solutions that have furthered the capabilities of x-ray and electron microscopy technologies.

Conclusion: N William Parker's innovative spirit and dedication to advancing x-ray and electron microscopy technologies underscore his significant contributions to the industry. With 27 patents and a history of impactful collaborations, Parker continues to pave the way for future advancements and innovations in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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