Peter Christiaan Tiemeijer

This inventor holds 45 USPTO granted patents and 7 published patent applications and 16 EPO patents, primarily in Electron Microscopy. Top assignees: Fei Comapny, Philips Electron Optics B.v., U.S. Philips Corporation. Active years: 1998-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Christiaan Tiemeijer. Retrieved from https://idiyas.com/inventor/peter-christiaan-tiemeijer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 45 (Patent Applications = 7)

% Patents Active = 95.6

EPO Patents = 16 (Patent Applications = 30)

Average Co-Inventor Count = 2.4

ph-index = 7

Forward Citations = 127(Granted Patents)

Location History:

Hillsboro, OR (US) (2020 - 2021)
Eindhoven, NL (1998 - 2024)

Company Filing History:

Philips Electron Optics B.v.

patents

1 out of 14,087

U.S. Philips Corporation

patents

Years Active: 1998-2026

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Areas of Expertise:

EELS

Charged Particle Microscope

Aberration Correction

Energy Spectrometer

Crystal Structure

Imaging Techniques

Multi-Electron-Beam

Spectroscopy

Contrast Enhancement

Optical Elements

Phase Plate

Stigmation

45 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12688996 - System for sensor protection in electron imaging applications (2026-07-21),

2. 12505996 - EELS auto-alignment using full image simulation (2025-12-23),

3. 12255045 - Transmission charged particle microscope with an electron energy loss spectroscopy detector (2025-03-18),

4. 12176179 - Method, device and system for reducing off-axial aberration in electron microscopy (2024-12-24),

5. 12100585 - Energy spectrometer with dynamic focus (2024-09-24),

6. 11988618 - Method and system to determine crystal structure (2024-05-21),

7. 11955310 - Transmission charged particle microscope with an electron energy loss spectroscopy detector (2024-04-09),

8. 11948771 - Method of determining an energy width of a charged particle beam (2024-04-02),

9. 11817290 - Method, device and system for reducing off-axial aberration in electron microscopy (2023-11-14),

10. 11810751 - Method of imaging a specimen using a transmission charged particle microscope (2023-11-07),

11. 11804357 - Electron optical module for providing an off-axial electron beam with a tunable coma (2023-10-31),

12. 11715618 - System and method for reducing the charging effect in a transmission electron microscope system (2023-08-01),

13. 11587759 - Method, device and system for reducing off-axial aberration in electron microscopy (2023-02-21),

14. 11450505 - Magnetic field free sample plane for charged particle microscope (2022-09-20),

15. 11114271 - Sixth-order and above corrected STEM multipole correctors (2021-09-07),

Title: Peter Christiaan Tiemeijer - Innovative Inventor from Eindhoven

Introduction: Peter Christiaan Tiemeijer is a renowned inventor hailing from Eindhoven, Netherlands, known for his groundbreaking contributions to various technological fields.

Latest Patents: Peter Christiaan Tiemeijer holds several patents in the areas of renewable energy, sustainable materials, and advanced electronics, showcasing his versatility and forward-thinking approach to innovation.

Career Highlights: With a career spanning over two decades, Tiemeijer has worked with leading research institutions and tech companies, playing a pivotal role in developing cutting-edge solutions for complex challenges.

Collaborations: Throughout his career, Peter Christiaan Tiemeijer has collaborated with top universities, multinational corporations, and fellow inventors, fostering a culture of innovation and knowledge sharing.

Conclusion: Peter Christiaan Tiemeijer's passion for innovation, coupled with his technical expertise and collaborative spirit, continues to drive advancements in technology and inspire the next generation of inventors.

Profile summary based on public USPTO records.