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Eindhoven, Netherlands

Peter Christiaan Tiemeijer

USPTO Granted Patents = 44 (Patent Applications = 7)

EPO Patents = 14 (Patent Applications = 26)

Average Co-Inventor Count = 2.4

ph-index = 7

Forward Citations = 123(Granted Patents)

Location History:

Hillsboro, OR (US) (2020 - 2021)
Eindhoven, NL (1998 - 2024)

Company Filing History:

Philips Electron Optics B.v.

1 out of 14,087

U.S. Philips Corporation

Years Active: 1998-2025

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Areas of Expertise:

Transmission Electron Microscopy

Energy Loss Spectroscopy

Aberration Correction

Electron Optical Module

Multi-Electron-Beam Imaging

Spectroscopy Techniques

Charged Particle Beam

Environmental Electron Microscopy

Hybrid Phase Plate

Lithography Apparatus

Crystal Structure Determination

Optical Element Centering

44 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12505996 - EELS auto-alignment using full image simulation (2025-12-23),

2. 12255045 - Transmission charged particle microscope with an electron energy loss spectroscopy detector (2025-03-18),

3. 12176179 - Method, device and system for reducing off-axial aberration in electron microscopy (2024-12-24),

4. 12100585 - Energy spectrometer with dynamic focus (2024-09-24),

5. 11988618 - Method and system to determine crystal structure (2024-05-21),

6. 11955310 - Transmission charged particle microscope with an electron energy loss spectroscopy detector (2024-04-09),

7. 11948771 - Method of determining an energy width of a charged particle beam (2024-04-02),

8. 11817290 - Method, device and system for reducing off-axial aberration in electron microscopy (2023-11-14),

9. 11810751 - Method of imaging a specimen using a transmission charged particle microscope (2023-11-07),

10. 11804357 - Electron optical module for providing an off-axial electron beam with a tunable coma (2023-10-31),

11. 11715618 - System and method for reducing the charging effect in a transmission electron microscope system (2023-08-01),

12. 11587759 - Method, device and system for reducing off-axial aberration in electron microscopy (2023-02-21),

13. 11450505 - Magnetic field free sample plane for charged particle microscope (2022-09-20),

14. 11114271 - Sixth-order and above corrected STEM multipole correctors (2021-09-07),

15. 11024483 - Transmission charged particle microscope with adjustable beam energy spread (2021-06-01),

Title: Peter Christiaan Tiemeijer - Innovative Inventor from Eindhoven

Introduction: Peter Christiaan Tiemeijer is a renowned inventor hailing from Eindhoven, Netherlands, known for his groundbreaking contributions to various technological fields.

Latest Patents: Peter Christiaan Tiemeijer holds several patents in the areas of renewable energy, sustainable materials, and advanced electronics, showcasing his versatility and forward-thinking approach to innovation.

Career Highlights: With a career spanning over two decades, Tiemeijer has worked with leading research institutions and tech companies, playing a pivotal role in developing cutting-edge solutions for complex challenges.

Collaborations: Throughout his career, Peter Christiaan Tiemeijer has collaborated with top universities, multinational corporations, and fellow inventors, fostering a culture of innovation and knowledge sharing.

Conclusion: Peter Christiaan Tiemeijer's passion for innovation, coupled with his technical expertise and collaborative spirit, continues to drive advancements in technology and inspire the next generation of inventors.

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