The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Aug. 09, 2023
Applicant:

Fei Company, Hillsboro, OR (US);

Inventors:

Peter Christiaan Tiemeijer, Eindhoven, NL;

Erwin De Jong, Best, NL;

Andrei Radulescu, Veldhoven, NL;

James Mccormack, Eindhoven, NL;

Jeroen Keizer, Winterlre, NL;

Assignee:

FEI COMPANY, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
H01J 37/265 (2013.01); H01J 2237/24507 (2013.01);
Abstract

The invention relates to a system for sensor protection in electron imaging applications comprising a beam control device configured to provide a beam signal based on an incoming beam signal, wherein the beam signal comprises an altered beam intensity, wherein the beam control device is further configured to receive a control signal and to activate based on the control signal. The system further comprises a sensor configured to capture the beam signal and to provide a capture signal based on the beam signal, and a control module configured to provide the control signal to the beam control device, to generate an exposure value based on the capture signal and to modify the control signal based on the exposure value.


Find Patent Forward Citations

Tiemeijer, Peter. (2026). System for sensor protection in electron imaging applications (U.S. Patent No. 12688996). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12688996

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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