For the Inventor, By the Inventor

Enter assignee name

Carl Zeiss Microscopy Gmbh

USPTO Granted Patents = 756

% Expired Patents = 7.3

EPO Patents = 305

Trademarks = 17

Forward Citations = 1,696

Loading Chart...

Loading Chart...

588 inventors (with patents filed for the assignee):

Thomas Kalkbrenner (70 out of 70 patents)

Daniel Haase (58 out of 59 patents)

Manuel Amthor (52 out of 55 patents)

4. Ralf Wolleschensky (50 out of 121 patents)

5. Ingo Kleppe (49 out of 50 patents)

6. Helmut Lippert (45 out of 48 patents)

7. Daniel Schwedt (44 out of 44 patents)

8. Tiemo Anhut (43 out of 43 patents)

9. Ralf Netz (38 out of 42 patents)

10. Yauheni Novikau (29 out of 30 patents)

11. Jörg Siebenmorgen (29 out of 29 patents)

12. Matthias Wald (28 out of 33 patents)

13. Josef Biberger (26 out of 27 patents)

14. Thomas Ohrt (25 out of 26 patents)

15. John Anthony Notte, Iv (22 out of 51 patents)

Core Competencies:

Light-Field Microscopy

Image Segmentation

Autofocusing

Fluorescence Correlation Spectroscopy

Three-Dimensional Imaging

Particle Beam Systems

Machine Learning

Optical Detection

Structured Illumination

Cell Counting

Depth Map Analysis

Microscope Imaging

756 patents: Sort by Forward Citations

1. 12761134 - Particle analysis using light microscope and multi-pixel polarization filter (2026-10-13),

2. 12738452 - Method for operating a particle beam microscope (2026-09-15),

3. 12737844 - Method, apparatus and software program for increasing resolution in microscopy (2026-09-15),

4. 12736791 - Microscope for determining properties of moving objects in a biological sample (2026-09-15),

5. 12731757 - Device and method for preparing microscopic samples via backside thinning (2026-09-08),

6. 12730304 - Infinity-corrected microscope objective for scanning applications (2026-09-08),

7. 12725253 - Method and device for preparing data for identifying analytes (2026-09-01),

8. 12704704 - Finity-corrected microscope objective for scanning applications (2026-08-11),

9. 12693511 - Light microscope with automatic focusing (2026-07-28),

10. 12693223 - Method and apparatus for detecting fluorescence signals in a three-dimensional region of a sample (2026-07-28),

11. 12682614 - Microscopy system and method for calculating a result image using an ordinal classification model (2026-07-14),

12. 12670703 - Microscopy system and method for generating a virtually stained image (2026-06-30),

13. 12670551 - Microscopy system and method for reducing an image vignetting (2026-06-30),

14. 12665165 - Method for preparing a microscopic sample for FIB/SEM tomography (2026-06-23),

15. 12664767 - Microscopy system and method for testing a sensitivity of an image processing model (2026-06-23),

Company Overview

Carl Zeiss Microscopy GmbH, based in Jena, Germany, specializes in advanced microscopy systems that enhance scientific research and industrial applications. The company focuses on innovative technologies such as light-field microscopy, image segmentation, and autofocusing, enabling precise imaging and analysis. With expertise in fluorescence correlation spectroscopy and three-dimensional imaging, Zeiss integrates machine learning and optical detection to push the boundaries of microscopy, supporting various fields including life sciences and materials research.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

756 Patents

#2 in Jena

#67 in Germany

#1,316 in the World

Carl Zeiss Microscopy Gmbh

Forward Citations = 1,696

588 inventors:

Thomas Kalkbrenner (70 out of 70 patents)

Daniel Haase (58 out of 59 patents)

Manuel Amthor (52 out of 55 patents)

4. Ralf Wolleschensky (50 out of 121 patents)

5. Ingo Kleppe (49 out of 50 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Carl Zeiss Microscopy Gmbh. Retrieved from https://idiyas.com/company/carl-zeiss-microscopy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…