The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Jun. 28, 2024
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Daniel Werdehausen, Oberkochen, DE;
Yueqian Zhang, Jena, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 9/12 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/02 (2013.01); G02B 9/12 (2013.01); G02B 21/367 (2013.01);
Abstract
A finity-corrected microscope objective for scanning applications has a numerical aperture of at least and an object field diameter of at least 1 mm. The objective is apochromatically corrected over a spectral bandwidth of at least 200 nm. A distance between an object plane and an intermediate image plane conjugated thereto is not more than 250 mm.