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For the Inventor, By the Inventor

Jena, Germany

Yauheni Novikau

This inventor holds 30 USPTO granted patents and 3 published patent applications and 17 EPO patents, primarily in High-Resolution Microscopy. Top assignees: Carl Zeiss Microscopy Gmbh, Carl Zeiss Ag. Active years: 2014-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yauheni Novikau. Retrieved from https://idiyas.com/inventor/yauheni-novikau

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 30 

% Patents Active = 90.0

 

Average Co-Inventor Count = 2.8

ph-index = 3

Forward Citations = 46(Granted Patents)


Location History:

  • Jena, DE (2014 - 2022)
  • Apolda, DE (2021 - 2024)

Company Filing History:

goldMedal29 out of 757 
 
Carl Zeiss Microscopy Gmbh
 patents
silverMedal1 out of 222 
 
Carl Zeiss Ag
 patents

Years Active: 2014-2026

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Areas of Expertise:
Microscopy
High-Resolution
Structured Illumination
Localization Microscopy
Fluorescence
Scanning Microscopy
Image Evaluation
3D Imaging
Deconvolution
Spectrally Selective
Point Spread Function
Fluorescence Correlation Spectroscopy
30 patents (USPTO):Explore Patents
1. 12737844 - Method, apparatus and software program for increasing resolution in microscopy (2026-09-15),
2. 12518412 - Method and device for light field microscopy (2026-01-06),
3. 12105271 - Microscope and method for microscopic image recording with variable illumination (2024-10-01),
4. 12094081 - Method for super-resolution evaluation of microscope images illuminated in a structured manner and microscope having structured illumination (2024-09-17),
5. 11954831 - Method of image evaluation for sim microscopy and sim microscopy method (2024-04-09),
6. 11867894 - Method for SIM microscopy (2024-01-09),
7. 11428634 - Method for localizing signal sources in localization microscopy (2022-08-30),
8. 11386531 - Method for deconvolving image data (2022-07-12),
9. 11372223 - High-resolution scanning microscopy (2022-06-28),
10. 11221297 - Accelerated methods and apparatuses for three-dimensional microscopy with structured illumination (2022-01-11),
11. 11209636 - High-resolution scanning microscopy (2021-12-28),
12. 11204489 - High-resolution scanning microscopy with discrimination between at least two wavelength ranges (2021-12-21),
13. 10996452 - High-resolution 2D microscopy with improved section thickness (2021-05-04),
14. 10883940 - Fluctuation-based fluorescence microscopy (2021-01-05),
15. 10649188 - High-resolution spectrally selective scanning microscopy of a sample (2020-05-12),

Title: Yauheni Novikau: Pioneering Innovations in SIM Microscopy

Introduction:

Yauheni Novikau, a distinguished inventor based in Jena, Germany, is renowned for his remarkable passion for innovation and relentless dedication to advancing technology in the field of inventions. With a total of 26 patents to his name, Novikau's inventive spirit continues to inspire progress in the realm of cutting-edge technologies.

Latest Patents:

1. Method of Image Evaluation for SIM Microscopy: This patent introduces a comprehensive method for evaluating images in SIM (Structured Illumination Microscopy), involving a sophisticated iteration process that enhances the quality and accuracy of imaging results.

2. Method for SIM Microscopy: Another groundbreaking patent by Novikau, this method focuses on optimizing SIM microscopy by generating multiple raw images with individually positioned SIM illumination patterns, ultimately leading to improved image reconstruction with suppressed diffraction orders.

Career Highlights:

Having made significant contributions to the field, Yauheni Novikau has worked with esteemed companies such as Carl Zeiss Microscopy GmbH and Carl Zeiss AG. His innovative mindset and technical expertise have played a pivotal role in developing advanced microscopy technologies that redefine industry standards.

Collaborations:

Throughout his career, Novikau has collaborated closely with accomplished professionals in the field, including esteemed colleagues like Ingo Kleppe and Ralf Netz. Together, they have synergized their talents to drive forward groundbreaking inventions and elevate the field of microscopy.

Conclusion:

In conclusion, Yauheni Novikau stands out as a visionary inventor whose relentless pursuit of innovation has propelled the field of SIM microscopy to new heights. His latest patents demonstrate his commitment to pushing boundaries and fueling progress in the world of inventions, inspiring fellow inventors and researchers to strive for excellence in their endeavors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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