The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Mar. 19, 2019
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 15/14 (2006.01); G02B 21/36 (2006.01); G02B 6/08 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0072 (2013.01); G02B 6/08 (2013.01); G02B 15/142 (2019.08); G02B 21/008 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G02B 21/361 (2013.01); H04N 7/183 (2013.01);
Abstract
A microscope and method for high resolution scanning microscopy of a sample, having an illumination device, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device is used for detecting the single image in the detection plane for various scan positions, with a location accuracy which, taking into account the reproduction scale in at least one dimension/measurement, is at least twice as high as a full width at half maximum of the diffraction-limited single image.