The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Nov. 12, 2019
Carl Zeiss Microscopy Gmbh, Jena, DE;
Thomas Kalkbrenner, Jena, DE;
Yauheni Novikau, Apolda, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A fluctuation-based fluorescence microscopy method, comprising influencing a point-spread function of the imaging of a sample emitting fluorescence radiation using an optical device in dependence on a parameter such that a point emitter is imaged into a representation with two image lobes. The relative positions of the lobes depend on the position of the point emitter relative to the focal plane. Synthetic pixels, smaller than detector pixels, are generated; for each synthetic pixel, pairs of pixel groups are defined among pixels of the detector based on the influencing of the point spread function. Each pair is assigned to an individual value of the parameter. In each frame and for each synthetic pixel, a signal correlation is ascertained and allocated as image brightness to the synthetic pixel for the parameter specification. Subframes for each frame are produced from the synthetic pixels, and a high-resolution sample image is produced from the subframes.