The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Jul. 19, 2021
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention relates to a microscope having an excitation beam path for guiding excitation light, having a laser light source for providing a laser light beam as excitation light and having a scanning apparatus for aligning and moving a focused laser light beam in the entrance pupil of an illumination objective; wherein the laser focus is directed into an entrance point that is offset with respect to the optical axis of the illumination objective; and also having a detection beam path for guiding detection light, comprising a microlens array having a focal plane for generating partial imaged presentations and a detector arranged in the focal plane of the microlens array for capturing the partial imaged presentations. In addition, an evaluation unit for evaluating the captured image signals of the detector in accordance with light-field technology is present. The invention additionally relates to a method for microscopic image generation.