The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Feb. 28, 2020
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Stanislav Kalinin, Weimar, DE;

Volodymyr Kudryavtsev, Jena, DE;

Yauheni Novikau, Apolda, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06T 5/00 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01); G02B 21/0032 (2013.01); G02B 21/0072 (2013.01); G02B 21/0084 (2013.01);
Abstract

In a method for deconvolving image data, image data of an object are captured with a number n of confocal beam paths. The image data are converted into resultant image data by means of a point spread function. The resultant image data are deconvolved again in the frequency domain using a deconvolution function, wherein the deconvolution function contains the formation of at least a number n of sum terms and a Wiener parameter w. The results of the sum terms are stored in retrievable fashion; the Wiener parameter W is modified at least once proceeding from its original value and the deconvolution is carried out by means of the deconvolution function with the modified Wiener parameter w and the stored results of the sum terms.


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