The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Oct. 25, 2023
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Jörg Steinert, Jena, DE;
Yauheni Novikau, Jena, DE;
Daniel Schwedt, Jena, DE;
Thomas Egloff, Jena, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/557 (2017.01); G02B 21/08 (2006.01); G02B 21/36 (2006.01); H04N 13/20 (2018.01); H04N 23/951 (2023.01); H04N 23/957 (2023.01);
U.S. Cl.
CPC ...
G06T 7/557 (2017.01); G02B 21/08 (2013.01); G02B 21/365 (2013.01); H04N 13/20 (2018.05); H04N 23/951 (2023.01); H04N 23/957 (2023.01); G06T 2207/10056 (2013.01);
Abstract
A method and apparatus for light field microscopy, wherein the following method steps are performed: a) measuring an image data record of a sample using a light field arrangement; b) creating at least one partial data record from the image data record; c) reconstructing a three-dimensional object from the partial data record created in step b).