The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Nov. 07, 2022
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A description is given of a method for increasing resolution in microscopy, comprising providing at least one recorded sample image () which was generated by means of a microscope (), providing a point spread function which characterizes an imaging behaviour of the microscope (), and calculating a sample image with increased resolution from the recorded sample image (), wherein the calculating is effected in an iteration process (S) which repeatedly passes through an iteration loop (S; S) and which determines a correction image (-) from the recorded sample image () using the point spread function, wherein a difference between the correction image convolved with the point spread function and the recorded sample image () is minimized in the iteration process (S), and wherein in the iteration process (S) the passes through the iteration loop (S; S) are numbered with an ascending pass number (k) and each comprise a step size factor which is dependent on the pass number (k) of the respective pass and is determined without recourse to correction images.