The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
May. 16, 2023
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Indrajati Nicole Kastanja, Olching, DE;
Markus Cappellaro, Munich, DE;
Achim Schwarz, Taufkirchen, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/1433 (2024.01); G02B 21/00 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1433 (2024.01); G02B 21/0032 (2013.01); G01N 2015/1493 (2013.01); G01N 2015/1497 (2013.01);
Abstract
Techniques in connection with the use of a multi-pixel polarization filter in the light-microscopic examination of a sample object are described. In this way e.g. a particle analysis can be carried out, e.g. in particular for determining the technical cleanness of a surface of the sample object.
Kastanja, Indrajati. (2026). Particle analysis using light microscope and multi-pixel polarization filter (U.S. Patent No. 12761134). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761134
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile