The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
May. 30, 2022
Carl Zeiss Microscopy Gmbh, Jena, DE;
Alexander Freytag, Erfurt, DE;
Matthias Eibl, Jena, DE;
Christian Kungel, Penzberg, DE;
Anselm Brachmann, Jena, DE;
Daniel Haase, Zoellnitz, DE;
Manuel Amthor, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A computer-implemented method for generating an image processing model that calculates a virtually stained image from a microscope image comprises a training of the image processing model using training data comprising at least: microscope images as input data into the image processing model; target images formed using captured chemically stained images; and predefined segmentation masks that discriminate between image regions to be stained and image regions that are not to be stained. The image processing model is trained to calculate virtually stained images from the input microscope images by optimizing a staining reward/loss function that captures a difference between the virtually stained images and the target images. The predefined segmentation masks are taken into account in the training of the image processing model to compensate errors in the chemically stained images.