The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Jun. 28, 2024
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Daniel Werdehausen, Oberkochen, DE;
Yueqian Zhang, Jena, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G02B 9/64 (2006.01); G02B 21/00 (2006.01); G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0031 (2013.01); G02B 9/64 (2013.01); G02B 21/008 (2013.01); G02B 21/02 (2013.01);
Abstract
An infinity-corrected microscope objective for scanning applications has a relatively small number of lenses that are dependent on the etendue such that the objective has: i) a first etendue in the range of 0.8 mmto 1.8 mmand a maximum of nine lenses; or ii) a second etendue in the range of more than 1.8 mmand not more than 15 lenses.