The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
May. 18, 2020
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Manuel Amthor, Jena, DE;
Daniel Haase, Zöllnitz, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G02B 21/24 (2006.01); G06T 7/12 (2017.01); G06T 7/60 (2017.01); G06T 7/73 (2017.01); G06T 7/80 (2017.01); H04N 23/67 (2023.01); H04N 23/959 (2023.01);
U.S. Cl.
CPC ...
G02B 21/244 (2013.01); G06T 7/12 (2017.01); G06T 7/13 (2017.01); G06T 7/60 (2013.01); G06T 7/73 (2017.01); G06T 7/80 (2017.01); H04N 23/676 (2023.01); H04N 23/959 (2023.01); G06T 2207/10056 (2013.01); G06T 2207/10148 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/20164 (2013.01); G06T 2207/30168 (2013.01);
Abstract
In a method for automatically focusing a microscope, an overview image that shows a sample and an environment is recorded. An image processing algorithm ascertains in the overview image at least one boundary of an object that is not the sample itself. A focus setting is then ascertained at a location of at least one of the ascertained boundaries.